Hamaker constants are characteristic material properties that determine the magnitude of the nonlinear van der Waals force between atoms, molecules and nanoscale aggregates of atoms. This paper explores the novel possibility of using Harmonic Balance based nonlinear system identification methods to extract from the nonlinear vibration spectrum of resonant atomic force silicon microcantilevers, the Hamaker constants between a few atoms at the tip of the microcantilever and graphite, gold and silicon carbide samples. First, the nonlinear dynamics of a diving board microcantilever coupled to the samples through van der Waals force potentials are investigated through a discretized model of the system. Next, the feasibility of using Harmonic Balance based nonlinear system identification techniques are demonstrated using simulations of the discretized model. Finally the method is implemented on an AFM system. The results indicate that the proposed method provides a novel alternative way to measure Hamaker constants and the measured results are within the range of known experimental data.
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e-mail: raman@ecn.purdue.edu
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July 2004
Technical Papers
Frequency Domain Identification of Tip-sample van der Waals Interactions in Resonant Atomic Force Microcantilevers
Shuiqing Hu,
Shuiqing Hu
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907
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Stephen Howell,
Stephen Howell
Department of Physics, Purdue University, West Lafayette, IN 47907
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Arvind Raman,
e-mail: raman@ecn.purdue.edu
Arvind Raman
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907
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Ron Reifenberger,
Ron Reifenberger
Department of Physics, Purdue University, West Lafayette, IN 47907
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Matthew Franchek
Matthew Franchek
Department of Mechanical Engineering, University of Houston, 4800 Calhoun Road, Houston, Texas, 77204-4792
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Shuiqing Hu
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907
Stephen Howell
Department of Physics, Purdue University, West Lafayette, IN 47907
Arvind Raman
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907
e-mail: raman@ecn.purdue.edu
Ron Reifenberger
Department of Physics, Purdue University, West Lafayette, IN 47907
Matthew Franchek
Department of Mechanical Engineering, University of Houston, 4800 Calhoun Road, Houston, Texas, 77204-4792
Contributed by the Technical Committee on Vibration and Sound for publication in the Special Section on MEMS in the JOURNAL OF VIBRATION AND ACOUSTICS. Manuscript received February 2003; Revised February 2004. Associate Editor: K. Grosh.
J. Vib. Acoust. Jul 2004, 126(3): 343-351 (9 pages)
Published Online: July 30, 2004
Article history
Received:
February 1, 2003
Revised:
February 1, 2004
Online:
July 30, 2004
Citation
Hu, S., Howell, S., Raman, A., Reifenberger, R., and Franchek, M. (July 30, 2004). "Frequency Domain Identification of Tip-sample van der Waals Interactions in Resonant Atomic Force Microcantilevers ." ASME. J. Vib. Acoust. July 2004; 126(3): 343–351. https://doi.org/10.1115/1.1760560
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