Finite element (FE) simulations were performed to study yielding in single and bilayer (BL) film systems using a “yield zone map” approach. Onset of yielding was observed at the interface, substrate, surface, and film in HfB2/silicon and HfB2/stainless steel systems. The interface yield zone in HfB2/stainless steel system was found to be larger due to the dominant effect of interfacial stress gradients. Based on the FE simulations, empirical equations were derived for the maximum contact pressure required to initiate yield at the interface. For BL/substrate systems, onset of yield at the lower film/substrate interface occurred when film thickness ratio was in the range 0.5–5. The maximum contact pressure associated with the initial yielding at this interface is minimum compared to other locations. From the design point of view, for a BL system the preferable film thickness ratio was found to be 20, whereas the optimum hardness ratio ranges from 2 to 4. For these values, maximum contact pressure is very high (∼30 GPa), and thus, yield onset can be avoided at lower film/substrate interfaces. In addition, based on the obtained results, the advantages and disadvantages of using a BL film as compared to a single film and their relevance to practical applications are discussed.
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July 2016
Research-Article
Yield Maps for Single and Bilayer Thin Films Under Scratch
Abhish Chatterjee,
Abhish Chatterjee
Department of Materials Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
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Ali Beheshti,
Ali Beheshti
Department of Mechanical Engineering,
Lamar University,
Beaumont, TX 77710;
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843
Lamar University,
Beaumont, TX 77710;
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843
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Andreas A. Polycarpou,
Andreas A. Polycarpou
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843;
Texas A&M University,
College Station, TX 77843;
Department of Mechanical Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
e-mail: apolycarpou@tamu.edu
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
e-mail: apolycarpou@tamu.edu
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Pascal Bellon
Pascal Bellon
Department of Materials Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
Search for other works by this author on:
Abhish Chatterjee
Department of Materials Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
Ali Beheshti
Department of Mechanical Engineering,
Lamar University,
Beaumont, TX 77710;
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843
Lamar University,
Beaumont, TX 77710;
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843
Andreas A. Polycarpou
Department of Mechanical Engineering,
Texas A&M University,
College Station, TX 77843;
Texas A&M University,
College Station, TX 77843;
Department of Mechanical Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
e-mail: apolycarpou@tamu.edu
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
e-mail: apolycarpou@tamu.edu
Pascal Bellon
Department of Materials Science
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
and Engineering,
University of Illinois at Urbana-Champaign,
Urbana, IL 61801
1Present address: Intel Corporation, Hillsboro, OR 97124.
2Corresponding author.
Contributed by the Tribology Division of ASME for publication in the JOURNAL OF TRIBOLOGY. Manuscript received June 13, 2015; final manuscript received December 9, 2015; published online April 21, 2016. Assoc. Editor: Robert L. Jackson.
J. Tribol. Jul 2016, 138(3): 031402 (12 pages)
Published Online: April 21, 2016
Article history
Received:
June 13, 2015
Revised:
December 9, 2015
Citation
Chatterjee, A., Beheshti, A., Polycarpou, A. A., and Bellon, P. (April 21, 2016). "Yield Maps for Single and Bilayer Thin Films Under Scratch." ASME. J. Tribol. July 2016; 138(3): 031402. https://doi.org/10.1115/1.4032519
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