The authors have carried out extensive measurements of electron triboemission from the scratching of ceramics and semiconductors that are briefly summarized in this paper. Analysis of the frequency-domain distribution of typical triboemission count-pulse outputs suggested that their occurrence is not Poisson’s (e.g., it is not random). This paper presents a study on the hypothesis of deterministic-chaos origin for triboemission data. Electron triboemission outputs from the ceramics alumina, sapphire, silicon nitride, and the semiconductors Si and Ge are analyzed by means of extracting deterministic-chaos metrics. The results suggest that the low-level electron-emission components may be described by multiplicative processes of random initiation, while the superimposed large burst-type components may be of deterministic origin.
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July 2007
Technical Papers
A Deterministic-Chaos Study of Electron Triboemission Outputs Available to Purchase
G. J. Molina,
G. J. Molina
Department of Mechanical and Electrical Engineering Technology, College of Science and Technology,
e-mail: [email protected]
Georgia Southern University
, Statesboro, GA 30460
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M. J. Furey,
M. J. Furey
Department of Mechanical Engineering, College of Engineering,
Virginia Tech
, Blacksburg, VA 24060
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C. Kajdas
C. Kajdas
Institute for Fuels and Renewable Energy
, 31 Zwirki i Wigury Avenue, PL 02-091 Warsaw, Poland
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G. J. Molina
Department of Mechanical and Electrical Engineering Technology, College of Science and Technology,
Georgia Southern University
, Statesboro, GA 30460e-mail: [email protected]
M. J. Furey
Department of Mechanical Engineering, College of Engineering,
Virginia Tech
, Blacksburg, VA 24060
C. Kajdas
Institute for Fuels and Renewable Energy
, 31 Zwirki i Wigury Avenue, PL 02-091 Warsaw, PolandJ. Tribol. Jul 2007, 129(3): 679-683 (5 pages)
Published Online: January 23, 2007
Article history
Received:
May 3, 2006
Revised:
January 23, 2007
Citation
Molina, G. J., Furey, M. J., and Kajdas, C. (January 23, 2007). "A Deterministic-Chaos Study of Electron Triboemission Outputs." ASME. J. Tribol. July 2007; 129(3): 679–683. https://doi.org/10.1115/1.2736709
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