Compression of a Single Transverse Ridge in a Circular Elastohydrodynamic Contact

A detailed experimental study has been made of the behavior of a 100 nm high transversely oriented ridge in an elastohydrodynamic (EHD) contact. Ultra-thin film interferometry has been used to measure film profiles accurately over a very wide range of lubricant film thicknesses, from a few nanometers up to nearly one micron. This enables the recovery of the amplitude of the inlet perturbation geometry with increasing EHD film thickness to be quantified and compared with numerical predictions. In pure rolling under very thin film conditions, corresponding to a smooth surface EHD film thickness of 10 nm, the surfaces near the ridge were squashed down, leading to a constriction in the film of only about 9 percent of the height of the un-deformed ridge. As the EHD film thickness increased, this deformation recovered until the ridge constriction regained about 90 percent of its original height at film thicknesses of about 1 μm. However this relatively rapid recovery only occurred in pure rolling and is attributed to the local perturbation of film convergence which the ridge generates while in the inlet region. This propagates through the contact at the mean speed of the surfaces and—in pure rolling—acts to diminish the effect of local squeeze. When sliding was present, the ridge remained almost fully deformed even when the mean film thickness was as much as twice the height of the original ridge. In this case, the ridge travels through the contact at a different speed from the mean of the two surfaces. The consequent decoupling of the ridge and the convergence perturbation results in a large local pressure due to squeeze which acts to inhibit recovery of the ridge. The general trend of the behavior of the lubricated ridge is shown to be in good agreement with earlier theoretical results.