Micro-EHL problems of line contact have been solved by Newton-Raphson method. The results are given from the zero roughness amplitude to the value higher than the film thickness in the smooth surface solution. With the increase of the roughness amplitude, cavitations may be found inside the contact region. This situation is predicted by a critical roughness amplitude. The solutions are also given after the roughness exceeds to the critical value. From the results it is found that the film thickness is still thick enough even if the roughness is very high. The other factors to influence on the pressure and film thickness, such as loads, roughness wavelengths and oil compressibility, are considered as well.
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Research Papers
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Copyright © 1992
by The American Society of Mechanical Engineers
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