Generally, photovoltaic (PV) cell manufacturers provide technical information, at standard test conditions (STCs) and nominal operating cell temperature (NOCT) ratings. However, this information is not sufficient to accurately predict the module operations under dynamic weather. In this study, test is conducted under fluctuating irradiance conditions, provided by EN50530 test procedure, to evaluate the performance of multi crystalline silicon and thin-film PV cells. Particular attention is given to the influence that the level and the slope of irradiance change have on the energy yield of PV technologies. This analysis aimed at revealing the appropriate selection of PV technology for obtaining maximum power under dynamic weather conditions.

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