Gallium oxide is an emerging wide band-gap material that has the potential to penetrate the power electronics market in the near future. In this paper, a finite-element gallium oxide semiconductor model is presented that can predict the electrical and thermal characteristics of the device. The finite element model of the two-dimensional device architecture is developed inside the Sentaurus environment. A vertical FinFET device architecture is employed to assess the device’s behavior and its static and dynamic characteristics. Enhancement-mode device operation is realized with this type of device architecture without the need for any selective area doping. The dynamic thermal behavior of the device is characterized through its short-circuit behavior. Based on the device static and dynamic behavior, it is envisioned that reliable vertical transistors can be fabricated for the power electronics applications.

Sintered silver-based bonded interfaces are a critical enabling technology for high-temperature, compact, high-performance, and reliable wide-bandgap packages and components. High-pressure (∼40 MPa) sintered silver interfaces have been implemented commercially, most notably the commercial products offered by Semikron. To reduce manufacturing complexity, there is significant industry interest in pressure-less sintered silver interfaces. To this end, current formulations of sintered silver paste are comprised of purely nano-sized silver particles or a combination of nano- and micro-sized silver particles/flakes. It is essential to quantify the mechanical properties and determine the reliability of these interfaces prior to use in automotive power electronics applications. In this paper, research efforts at the National Renewable Energy Laboratory, in collaboration with Virginia Polytechnic Institute and State University and an industry partner, in optimizing the synthesis procedure and mechanical characterization of sintered silver double-lap samples are described. These double-lap samples were synthesized using pressure-less sintering techniques. Shear testing was conducted at multiple temperatures and displacement rates on these samples sintered using two types of sintered sintered silver pastes, one of them consisting of nano-silver particles and the other a hybrid paste or a combination of nano- and micron-sized silver flakes, employed in a double-lap configuration. Maximum values of shear stress obtained from the characterization study are reported.

In automotive power electronics packages, conventional thermal interface materials such as greases, gels, and phase change materials pose bottlenecks to heat removal and are also associated with reliability concerns. There is an industry trend towards high thermal performance bonded interfaces. However, due to coefficient of thermal expansion mismatches between materials/layers and resultant thermomechanical stresses, adhesive and cohesive fractures could occur, posing a problem from a reliability standpoint. These defects manifest themselves in increased thermal resistance in the package. The objective of this research is to investigate and improve the thermal performance and reliability of emerging bonded interface materials for power electronics packaging applications. We present results for thermal performance and reliability of bonded interfaces based on thermoplastic (polyamide) adhesive, with embedded near-vertical aligned carbon fibers, as well as sintered silver material. The results for these two materials are compared to conventional lead-based (Sn63Pb37) bonded interfaces. These materials were bonded between 50.8-mm × 50.8-mm cross-sectional footprint silicon nitride substrates and copper base plate samples. Samples of the substrate/base plate bonded assembly underwent thermal cycling from −40°C to 150°C according to Joint Electron Devices Engineering Council standard Number 22-A104D for up to 2,000 cycles. The dwell time of the cycle was 10 minutes and the ramp rate was 5°C/minute. Damage was monitored every 100 cycles by acoustic microscopy as an indicator of an increase in thermal resistance of the interface layer. The acoustic microscopic images of the bonded interfaces after 2,000 thermal cycles showed that thermoplastics with embedded carbon fibers performed quite well with no defects, whereas interface delamination occurred in the case of sintered silver material. Both these materials showed a superior bond quality as compared to the lead-based solder interface even after 1,000 thermal cycles.