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Proceedings Papers

Optimization of Ultra-High Aspect Ratio Nanostructures Fabricated Using Glancing Angle Deposition

Chuang Qu, Bruce Alphenaar, Shamus McNamara, Kevin Walsh
Proc. ASME. MSEC2021, Volume 2: Manufacturing Processes; Manufacturing Systems; Nano/Micro/Meso Manufacturing; Quality and Reliability, V002T08A001, June 21–25, 2021
Paper No: MSEC2021-59847
DOI: https://doi.org/10.1115/MSEC2021-59847
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Topics: Nanostructures , Optimization, Columns (Structural), Design, Shades and shadows, Surface properties, Vapors
Proceedings Papers

Characterizing the Conductivity of Aerosol Jet Printed Silver Features on Glass

Dilan Ratnayake, Alexander Thomas Curry, Chuang Qu, John Usher, Kevin Walsh
Proc. ASME. MSEC2021, Volume 2: Manufacturing Processes; Manufacturing Systems; Nano/Micro/Meso Manufacturing; Quality and Reliability, V002T08A007, June 21–25, 2021
Paper No: MSEC2021-63803
DOI: https://doi.org/10.1115/MSEC2021-63803
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Topics: Aerosols, Electrical conductivity, Glass, Printing, Silver, Sintering, Thermal conductivity
Proceedings Papers

Dual Extrusion FDM Printer for Flexible and Rigid Polymers

Garrett McGrady, Kevin Walsh
Proc. ASME. MSEC2020, Volume 1: Additive Manufacturing; Advanced Materials Manufacturing; Biomanufacturing; Life Cycle Engineering; Manufacturing Equipment and Automation, V001T01A009, September 3, 2020
Paper No: MSEC2020-8377
DOI: https://doi.org/10.1115/MSEC2020-8377
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Topics: Extruding, Polymers, Printing, Additive manufacturing, High temperature, Temperature, Bridges (Structures), Calibration, Computer software, Design
Proceedings Papers

Embedded Sensing Capabilities in an FDM Printed Object

Garrett McGrady, Neel Jain, Douglas Jackson, Kevin Walsh
Proc. ASME. MSEC2020, Volume 1: Additive Manufacturing; Advanced Materials Manufacturing; Biomanufacturing; Life Cycle Engineering; Manufacturing Equipment and Automation, V001T01A010, September 3, 2020
Paper No: MSEC2020-8378
DOI: https://doi.org/10.1115/MSEC2020-8378
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Topics: Accelerometers, Additive manufacturing, Bending (Stress), Bridges (Structures), Buckling, Cavities, Circuits, Design, Diaphragms (Mechanical devices), Diaphragms (Structural)
Proceedings Papers

Fabrication of Nanochannels Using Glancing Angle Deposition With Line Seeds

Chuang Qu, Dilan Ratnayake, Bruce Alphenaar, Shamus McNamara, Kevin Walsh
Proc. ASME. MSEC2020, Volume 2: Manufacturing Processes; Manufacturing Systems; Nano/Micro/Meso Manufacturing; Quality and Reliability, V002T08A025, September 3, 2020
Paper No: MSEC2020-8450
DOI: https://doi.org/10.1115/MSEC2020-8450
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Topics: Manufacturing, Nanochannels, Nanofluidics
Proceedings Papers

Fabrication of Ti Retinal Microtacks Using Ultra-High-Precision Micromilling

Scott Cambron, Robert Keynton, Kevin Walsh, John Naber, Henry Kaplan, Doug Shire, Joseph Rizzo
Proc. ASME. IMECE2003, Advances in Bioengineering, 51-52, November 15–21, 2003
Paper No: IMECE2003-43997
DOI: https://doi.org/10.1115/IMECE2003-43997
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Topics: Manufacturing, Micromilling, Design, Bonding, Semiconductor wafers, Titanium
Proceedings Papers

Design and Fabrication of Microtacks for Retinal Implant Applications

Scott Cambron, Robert Keynton, Jose Franco, Mark Crain, Doug Shire, Kevin Walsh, John Naber, Henry Kaplan, Joseph Rizzo
Proc. ASME. IMECE2003, Microelectromechanical Systems, 247-249, November 15–21, 2003
Paper No: IMECE2003-41572
DOI: https://doi.org/10.1115/IMECE2003-41572
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Topics: Design, Manufacturing, Micromilling, Semiconductor wafers, Chisels, Control equipment, Machinery, Machining, Micromachining, Polishing
Proceedings Papers

Design, Analysis, and Testing of Electrostatically Actuated Micromembranes

Lucas Yeary, Glenn Cunningham, Nagesh Panduga, Corinne Darvennes, Kevin Walsh, Mark Crain, Robert W. Cohn, Steven A. Harfenist, Jeff Frolik
Proc. ASME. IMECE2003, Microelectromechanical Systems, 583-588, November 15–21, 2003
Paper No: IMECE2003-41155
DOI: https://doi.org/10.1115/IMECE2003-41155
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Topics: Design, Testing, Membranes, Deflection, Engineering simulation, Simulation, Dimensions, Electrical measurement, Electrodes, Finite element analysis