Yttria-stabilized hafnia (YSH) coatings were grown onto stainless steel 403 (SS-403) and Si substrates. The deposition was made at various growth temperatures ranging from room temperature (RT) to 500 °C. The microstructure and thermal properties of the YSH coatings were evaluated employing grazing incidence X-ray diffraction (GIXRD), scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS), and photoacoustic measurements. GIXRD studies indicate that the coatings crystalize in cubic structure with a (111) texturing. Well-grown triangular dense morphology was evident in SEM data. EDS analysis indicates the composition stability of YSH coatings. The grain size increases with the increasing growth temperature. Thermal conductivity measurements indicate lower thermal conductivity of YSH coatings compared to either pure hafnia or yttria-stabilized zirconia.

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