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J. Eng. Mater. Technol. July 2000, 122(3): 245. doi: https://doi.org/10.1115/1.482811

Technical Papers

J. Eng. Mater. Technol. July 2000, 122(3): 246–255. doi: https://doi.org/10.1115/1.482794
J. Eng. Mater. Technol. July 2000, 122(3): 256–258. doi: https://doi.org/10.1115/1.482795
J. Eng. Mater. Technol. July 2000, 122(3): 259–263. doi: https://doi.org/10.1115/1.482796
J. Eng. Mater. Technol. July 2000, 122(3): 264–268. doi: https://doi.org/10.1115/1.482797
J. Eng. Mater. Technol. July 2000, 122(3): 269–272. doi: https://doi.org/10.1115/1.482812
J. Eng. Mater. Technol. July 2000, 122(3): 273–278. doi: https://doi.org/10.1115/1.482798
J. Eng. Mater. Technol. July 2000, 122(3): 279–282. doi: https://doi.org/10.1115/1.482799
J. Eng. Mater. Technol. July 2000, 122(3): 283–293. doi: https://doi.org/10.1115/1.482813
J. Eng. Mater. Technol. July 2000, 122(3): 294–299. doi: https://doi.org/10.1115/1.482800
J. Eng. Mater. Technol. July 2000, 122(3): 300–304. doi: https://doi.org/10.1115/1.482801
J. Eng. Mater. Technol. July 2000, 122(3): 305–314. doi: https://doi.org/10.1115/1.482802
J. Eng. Mater. Technol. July 2000, 122(3): 315–320. doi: https://doi.org/10.1115/1.482803
J. Eng. Mater. Technol. July 2000, 122(3): 321–326. doi: https://doi.org/10.1115/1.482804
J. Eng. Mater. Technol. July 2000, 122(3): 327–332. doi: https://doi.org/10.1115/1.482814
J. Eng. Mater. Technol. July 2000, 122(3): 333–337. doi: https://doi.org/10.1115/1.482805
J. Eng. Mater. Technol. July 2000, 122(3): 338–341. doi: https://doi.org/10.1115/1.482806
J. Eng. Mater. Technol. July 2000, 122(3): 342–347. doi: https://doi.org/10.1115/1.482807
J. Eng. Mater. Technol. July 2000, 122(3): 348–354. doi: https://doi.org/10.1115/1.482808
J. Eng. Mater. Technol. July 2000, 122(3): 355–362. doi: https://doi.org/10.1115/1.482809
J. Eng. Mater. Technol. July 2000, 122(3): 363–367. doi: https://doi.org/10.1115/1.482810
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