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Journal Articles

Process Robustness of Hot Embossing Microfluidic Devices

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Thor Eusner, Melinda Hale, David E. Hardt
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030920.
https://doi.org/10.1115/1.4001421
Published Online: June 14, 2010
View Articletitled, Process Robustness of Hot Embossing Microfluidic Devices
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Topics: Design, Embossing, Microfluidics, Response surface methodology, Robustness, Pressure, Polymers, Temperature, Manufacturing
Journal Articles

Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment

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J. S. Lewis, S. D. Gittard, R. J. Narayan, C. J. Berry, R. L. Brigmon, R. Ramamurti, R. N. Singh
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030919.
https://doi.org/10.1115/1.4001583
Published Online: June 14, 2010
View Articletitled, Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment
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Topics: Chemical vapor deposition, Coatings, Diamond films, Diamonds, Grain size, Biomaterials, Thin films, Flow (Dynamics), Stainless steel, Density
Journal Articles

Probe-Tip Induced Damage in Compliant Substrates

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Michael Chandross, Christian D. Lorenz, Mark J. Stevens, Gary S. Grest
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030916.
https://doi.org/10.1115/1.4001660
Published Online: June 14, 2010
View Articletitled, Probe-Tip Induced Damage in Compliant Substrates
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Topics: Atomic force microscopy, Damage, Engineering simulation, Probes, Simulation, Stress, Shear (Mechanics), Compression, Tribology, Nanofabrication
Journal Articles

Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing

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Chris Y. Yuan, David A. Dornfeld
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030918.
https://doi.org/10.1115/1.4001686
Published Online: June 14, 2010
View Articletitled, Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing
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Topics: Cycles, Emissions, Energy consumption, Flow (Dynamics), Manufacturing, Microelectronic devices, Semiconductor wafers, Sustainability, Thin films, Water
Journal Articles

Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation

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Bijoyraj Sahu, Curtis R. Taylor, Kam K. Leang
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030917.
https://doi.org/10.1115/1.4001662
Published Online: June 14, 2010
View Articletitled, Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation
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Topics: Actuators, Design, Manufacturing, Microactuators, Nanoscale phenomena, Modeling
Journal Articles

Analysis of Molecular Beam Epitaxy Process for Growing Nanoscale Magnesium Oxide Films

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Ghulam M. Uddin, Zhuhua Cai, Katherine S. Ziemer, Abe Zeid, Sagar Kamarthi
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030913.
https://doi.org/10.1115/1.4001691
Published Online: June 9, 2010
View Articletitled, Analysis of Molecular Beam Epitaxy Process for Growing Nanoscale Magnesium Oxide Films
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Topics: Artificial neural networks, Magnesium (Metal), Molecular beam epitaxy, Oxygen, Temperature, Experimental design, Nanoscale phenomena
Journal Articles

A Statistical Analysis to Control the Growth of Cobalt Ferrite Nanoparticles Synthesized by the Thermodecomposition Method

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Victoria L. Calero-DdelC, Ana M. Gonzalez, Carlos Rinaldi
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030914.
https://doi.org/10.1115/1.4001717
Published Online: June 9, 2010
View Articletitled, A Statistical Analysis to Control the Growth of Cobalt Ferrite Nanoparticles Synthesized by the Thermodecomposition Method
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Topics: Cobalt, Ferrites (Magnetic materials), Nanoparticles, Nucleation (Physics), Particulate matter, Statistical analysis, Temperature, Experimental design
Journal Articles

Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)

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Kumar R. Virwani, Ajay P. Malshe, Kamlakar P. Rajurkar
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030915.
https://doi.org/10.1115/1.4001718
Published Online: June 9, 2010
View Articletitled, Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)
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Topics: Dielectric materials, Electric fields, Flow (Dynamics), Machining, Nanoscale phenomena, Tungsten, Manufacturing, Compression
Journal Articles

A Quasi-Static Mechanics Analysis of Three-Dimensional Nanoscale Surface Polishing

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H. Xu, K. Komvopoulos
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030912.
https://doi.org/10.1115/1.4001582
Published Online: June 3, 2010
View Articletitled, A Quasi-Static Mechanics Analysis of Three-Dimensional Nanoscale Surface Polishing
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Topics: Nanoparticles, Polishing, Surface roughness, Nanoscale phenomena, Steady state, Deformation, Pressure
Journal Articles

Rapid Nanomanufacturing of Metallic Break Junctions Using Focused Ion Beam Scratching and Electromigration

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Waseem Asghar, Priyanka P. Ramachandran, Adegbenro Adewumi, Mohammud R. Noor, Samir M. Iqbal
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030911.
https://doi.org/10.1115/1.4001664
Published Online: June 3, 2010
View Articletitled, Rapid Nanomanufacturing of Metallic Break Junctions Using Focused Ion Beam Scratching and Electromigration
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Topics: Electrodiffusion, Focused ion beams, Junctions, Metals, Nanomanufacturing, Electron beams, Electrodes
Journal Articles

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

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Zone-Ching Lin, Ming-Ho Chou
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030910.
https://doi.org/10.1115/1.4001685
Published Online: May 28, 2010
View Articletitled, Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope
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Topics: Near-field scanning optical microscopy, Optical fiber, Probes, Nanoscale phenomena, Optical microscopes, Atoms, Atomic interactions, Vibration
Journal Articles

Tip Based Nanomanipulation Through Successive Directional Push

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Wei Zhao, Kangmin Xu, Xiaoping Qian, Rong Wang
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030909.
https://doi.org/10.1115/1.4001676
Published Online: May 26, 2010
View Articletitled, Tip Based Nanomanipulation Through Successive Directional Push
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Topics: Atomic force microscopy, Particulate matter, Algorithms
Journal Articles

Study of a High Performance AFM Probe-Based Microscribing Process

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Keith Bourne, Shiv G. Kapoor, Richard E. DeVor
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030906.
https://doi.org/10.1115/1.4001414
Published Online: May 26, 2010
View Articletitled, Study of a High Performance AFM Probe-Based Microscribing Process
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Topics: Atomic force microscopy, Cutting, Geometry, Stress, Wear, Probes
Journal Articles

Integrated Two-Photon Polymerization With Nanoimprinting for Direct Digital Nanomanufacturing

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Wande Zhang, Li-Hsin Han, Shaochen Chen
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030907.
https://doi.org/10.1115/1.4001661
Published Online: May 26, 2010
View Articletitled, Integrated Two-Photon Polymerization With Nanoimprinting for Direct Digital Nanomanufacturing
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Topics: Glass, Lasers, Manufacturing, Nanomanufacturing, Photons, Polymerization, Polymers, Nanostructures , Silicon, Wavelength
Journal Articles

Unusual Applications of Machining: Controlled Nanostructuring of Materials and Surfaces

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C. Saldana, S. Swaminathan, T. L. Brown, W. Moscoso, J. B. Mann, W. D. Compton, S. Chandrasekar
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030908.
https://doi.org/10.1115/1.4001665
Published Online: May 26, 2010
View Articletitled, Unusual Applications of Machining: Controlled Nanostructuring of Materials and Surfaces
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Topics: Copper, Deformation, Machining, Particulate matter, Temperature, Nanomaterials
Journal Articles

Micromachined Ultrasonic Print-Head for Deposition of High-Viscosity Materials

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J. Mark Meacham, Amanda O’Rourke, Yong Yang, Andrei G. Fedorov, F. Levent Degertekin, David W. Rosen
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030905.
https://doi.org/10.1115/1.4001551
Published Online: May 19, 2010
View Articletitled, Micromachined Ultrasonic Print-Head for Deposition of High-Viscosity Materials
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Topics: Fluids, Manganese (Metal), Manufacturing, Micromachining, Nozzles, Photopolymers, Piezoelectric transducers, Printing, Resins, Surface tension
Journal Articles

Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling

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F. Marinello, S. Carmignato, A. Voltan, E. Savio, L. De Chiffre
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030903.
https://doi.org/10.1115/1.4001242
Published Online: May 13, 2010
View Articletitled, Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling
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Topics: Atomic force microscopy, Errors, Creep, Instrumentation
Journal Articles

Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes

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S. K. Tiwari, B. K. Paul
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030902.
https://doi.org/10.1115/1.4001554
Published Online: May 13, 2010
View Articletitled, Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes
Open the PDF for Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes in another window
Topics: Bonding, Brazing, Diffusion (Physics), Diffusion bonding (Metals), Nanoparticles, Nickel, Stainless steel
Journal Articles

Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy

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Santiago D. Solares, Gaurav Chawla
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030904.
https://doi.org/10.1115/1.4001579
Published Online: May 13, 2010
View Articletitled, Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy
Open the PDF for Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy in another window
Topics: Atomic force microscopy, Cantilevers, Imaging, Probes, Spectroscopy, Carbon nanotubes, Oscillations
Journal Articles

Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components

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E. B. Brousseau, F. Krohs, E. Caillaud, S. Dimov, O. Gibaru, S. Fatikow
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030901.
https://doi.org/10.1115/1.4001481
Published Online: May 13, 2010
View Articletitled, Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components
Open the PDF for Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components in another window
Topics: Atomic force microscopy, Chain, Surface roughness