Thin film shape memory alloys have recently become a promising material for the actuation of devices on the microscale such as micropumps and microvalves. Their utilization, however, has been limited due to the difficulty in tailoring their properties for different applications. Control over the transformation temperatures as well as mechanical and shape memory properties is required to enable their widespread use. This study examines the effects of heat treatment time and temperature on the properties of amorphous, Ti-rich NiTi thin films on silicon substrates. The effects on the transformation temperatures are investigated through the use of temperature dependent optical microscopy and temperature dependent X-ray diffraction. The indentation modulus and hardness, as well as dissipated energy and depth recovery, are obtained through nanoindentation and atomic force microscopy. The role of microstructure and composition in altering both the mechanical and shape memory properties of the films is discussed.
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October 2010
Research Papers
Annealing Effect on the Shape Memory Properties of Amorphous NiTi Thin Films
Gen Satoh,
Gen Satoh
Department of Mechanical Engineering,
e-mail: gs2358@columbia.edu
Columbia University
, New York, NY 10025
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Andrew Birnbaum,
Andrew Birnbaum
Department of Mechanical Engineering,
e-mail: ajb2118@columbia.edu
Columbia University
, New York, NY 10025
Search for other works by this author on:
Y. Lawrence Yao
Y. Lawrence Yao
Department of Mechanical Engineering,
e-mail: yly1@columbia.edu
Columbia University
, New York, NY 10025
Search for other works by this author on:
Gen Satoh
Department of Mechanical Engineering,
Columbia University
, New York, NY 10025e-mail: gs2358@columbia.edu
Andrew Birnbaum
Department of Mechanical Engineering,
Columbia University
, New York, NY 10025e-mail: ajb2118@columbia.edu
Y. Lawrence Yao
Department of Mechanical Engineering,
Columbia University
, New York, NY 10025e-mail: yly1@columbia.edu
J. Manuf. Sci. Eng. Oct 2010, 132(5): 051004 (9 pages)
Published Online: September 20, 2010
Article history
Received:
June 22, 2009
Revised:
July 1, 2010
Online:
September 20, 2010
Published:
September 20, 2010
Citation
Satoh, G., Birnbaum, A., and Yao, Y. L. (September 20, 2010). "Annealing Effect on the Shape Memory Properties of Amorphous NiTi Thin Films." ASME. J. Manuf. Sci. Eng. October 2010; 132(5): 051004. https://doi.org/10.1115/1.4002189
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