This paper presents an analytical model for predicting the variation in the pitch distance between pilot holes stamped with a progressive die. The model is useful in designing diesets since it relates pitch variation to dieset parameters such as the quantity of pilot pins, clearance in the stripper plate bearings, clearance about the punch, and clearance about the pilot pins. The efficacy of the predictive model is demonstrated with a sensitivity study of design parameters in an exemplary dieset used to stamp electrical contacts. Predictions from the model match previously measured variation within about twenty-four percent.
A Predictive Model for Variation in the Pitch Between Stamped Pilot Holes
Contributed by the Manufacturing Engineering Division for publication in the JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING. Manuscript received February 2002; Revised October 2002. Associate Editor: E. DeMeter.
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Vallance, R. R., and Kiani, S. (April 15, 2003). "A Predictive Model for Variation in the Pitch Between Stamped Pilot Holes ." ASME. J. Manuf. Sci. Eng. May 2003; 125(2): 384–393. https://doi.org/10.1115/1.1559158
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