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Proceedings Papers

Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems

12th International Conference on Advanced Vehicle and Tire Technologies

Advances in Methods for Vehicle Systems Design and Tire Modeling

IDETC-CIE 2010; 3-18doi:https://doi.org/10.1115/DETC2010-28002
IDETC-CIE 2010; 19-28doi:https://doi.org/10.1115/DETC2010-28043
IDETC-CIE 2010; 29-38doi:https://doi.org/10.1115/DETC2010-28160
IDETC-CIE 2010; 39-48doi:https://doi.org/10.1115/DETC2010-28268
IDETC-CIE 2010; 49-55doi:https://doi.org/10.1115/DETC2010-28278
IDETC-CIE 2010; 57-64doi:https://doi.org/10.1115/DETC2010-28375
IDETC-CIE 2010; 65-72doi:https://doi.org/10.1115/DETC2010-28745
IDETC-CIE 2010; 73-80doi:https://doi.org/10.1115/DETC2010-28772
IDETC-CIE 2010; 81-88doi:https://doi.org/10.1115/DETC2010-29103
IDETC-CIE 2010; 89-100doi:https://doi.org/10.1115/DETC2010-29160

Advances in Multibody Systems Modeling and Validation for Vehicle Dynamics Applications

IDETC-CIE 2010; 101-109doi:https://doi.org/10.1115/DETC2010-28103
IDETC-CIE 2010; 111-120doi:https://doi.org/10.1115/DETC2010-28195
IDETC-CIE 2010; 121-128doi:https://doi.org/10.1115/DETC2010-28251
IDETC-CIE 2010; 129-135doi:https://doi.org/10.1115/DETC2010-28318
IDETC-CIE 2010; 137-142doi:https://doi.org/10.1115/DETC2010-28655
Topics: Computers
IDETC-CIE 2010; 143-150doi:https://doi.org/10.1115/DETC2010-28941
IDETC-CIE 2010; 151-161doi:https://doi.org/10.1115/DETC2010-29067

Advances in Non-Conventional, Energy Efficient and Environmentally Friendly Vehicles

IDETC-CIE 2010; 163-171doi:https://doi.org/10.1115/DETC2010-28015
IDETC-CIE 2010; 173-181doi:https://doi.org/10.1115/DETC2010-28038
IDETC-CIE 2010; 183-195doi:https://doi.org/10.1115/DETC2010-28198
IDETC-CIE 2010; 197-204doi:https://doi.org/10.1115/DETC2010-28457
IDETC-CIE 2010; 205-218doi:https://doi.org/10.1115/DETC2010-28576
IDETC-CIE 2010; 219-227doi:https://doi.org/10.1115/DETC2010-28606
IDETC-CIE 2010; 229-233doi:https://doi.org/10.1115/DETC2010-28651
IDETC-CIE 2010; 235-240doi:https://doi.org/10.1115/DETC2010-28776
IDETC-CIE 2010; 241-247doi:https://doi.org/10.1115/DETC2010-28800
IDETC-CIE 2010; 249-258doi:https://doi.org/10.1115/DETC2010-28816
IDETC-CIE 2010; 259-264doi:https://doi.org/10.1115/DETC2010-29176
IDETC-CIE 2010; 265-273doi:https://doi.org/10.1115/DETC2010-29226

Advances in Vehicle Systems Dynamics and Control

IDETC-CIE 2010; 275-285doi:https://doi.org/10.1115/DETC2010-28062
IDETC-CIE 2010; 287-295doi:https://doi.org/10.1115/DETC2010-28128
IDETC-CIE 2010; 297-305doi:https://doi.org/10.1115/DETC2010-28238
IDETC-CIE 2010; 307-314doi:https://doi.org/10.1115/DETC2010-28252
IDETC-CIE 2010; 315-324doi:https://doi.org/10.1115/DETC2010-28467
IDETC-CIE 2010; 325-330doi:https://doi.org/10.1115/DETC2010-28553
IDETC-CIE 2010; 331-344doi:https://doi.org/10.1115/DETC2010-29059
IDETC-CIE 2010; 345-349doi:https://doi.org/10.1115/DETC2010-29083

Advances in Vehicle Systems Tools to Enhance Safety, Health, and Ergonomics

IDETC-CIE 2010; 351-364doi:https://doi.org/10.1115/DETC2010-28004
IDETC-CIE 2010; 365-382doi:https://doi.org/10.1115/DETC2010-28039
IDETC-CIE 2010; 383-389doi:https://doi.org/10.1115/DETC2010-28801

4th International Conference on Micro- and Nanosystems

Applied Mechanics, Contact Mechanics and Tribology at Micro- and Nano-Scales

IDETC-CIE 2010; 393-396doi:https://doi.org/10.1115/DETC2010-28040
IDETC-CIE 2010; 397-400doi:https://doi.org/10.1115/DETC2010-28219
IDETC-CIE 2010; 401-407doi:https://doi.org/10.1115/DETC2010-28427
IDETC-CIE 2010; 409-412doi:https://doi.org/10.1115/DETC2010-29144
IDETC-CIE 2010; 413-420doi:https://doi.org/10.1115/DETC2010-29233

Bio-MEMS/NEMS

IDETC-CIE 2010; 421-427doi:https://doi.org/10.1115/DETC2010-28115
IDETC-CIE 2010; 429-437doi:https://doi.org/10.1115/DETC2010-28541
IDETC-CIE 2010; 439-445doi:https://doi.org/10.1115/DETC2010-28612
IDETC-CIE 2010; 447-451doi:https://doi.org/10.1115/DETC2010-28894
IDETC-CIE 2010; 453-459doi:https://doi.org/10.1115/DETC2010-29047

Dynamic Atomic Force Microscopy

IDETC-CIE 2010; 461-467doi:https://doi.org/10.1115/DETC2010-28099
IDETC-CIE 2010; 469-476doi:https://doi.org/10.1115/DETC2010-28196
IDETC-CIE 2010; 477-487doi:https://doi.org/10.1115/DETC2010-28451
IDETC-CIE 2010; 489-497doi:https://doi.org/10.1115/DETC2010-28686
IDETC-CIE 2010; 499-506doi:https://doi.org/10.1115/DETC2010-28762
IDETC-CIE 2010; 507-516doi:https://doi.org/10.1115/DETC2010-29022
IDETC-CIE 2010; 517-524doi:https://doi.org/10.1115/DETC2010-29029
IDETC-CIE 2010; 525-531doi:https://doi.org/10.1115/DETC2010-29165
IDETC-CIE 2010; 533-540doi:https://doi.org/10.1115/DETC2010-29225

Dynamics of MEMS and NEMS

IDETC-CIE 2010; 541-546doi:https://doi.org/10.1115/DETC2010-28122
IDETC-CIE 2010; 547-554doi:https://doi.org/10.1115/DETC2010-28430
IDETC-CIE 2010; 555-560doi:https://doi.org/10.1115/DETC2010-28454
IDETC-CIE 2010; 561-569doi:https://doi.org/10.1115/DETC2010-28487
IDETC-CIE 2010; 571-577doi:https://doi.org/10.1115/DETC2010-28534
IDETC-CIE 2010; 579-588doi:https://doi.org/10.1115/DETC2010-28590
IDETC-CIE 2010; 589-599doi:https://doi.org/10.1115/DETC2010-28637
IDETC-CIE 2010; 601-611doi:https://doi.org/10.1115/DETC2010-28684
IDETC-CIE 2010; 613-620doi:https://doi.org/10.1115/DETC2010-28781
IDETC-CIE 2010; 621-629doi:https://doi.org/10.1115/DETC2010-28899
IDETC-CIE 2010; 631-638doi:https://doi.org/10.1115/DETC2010-28983
IDETC-CIE 2010; 639-644doi:https://doi.org/10.1115/DETC2010-28990
IDETC-CIE 2010; 645-652doi:https://doi.org/10.1115/DETC2010-29024
IDETC-CIE 2010; 653-660doi:https://doi.org/10.1115/DETC2010-29040

Energy Harvesting

IDETC-CIE 2010; 661-667doi:https://doi.org/10.1115/DETC2010-28429
IDETC-CIE 2010; 669-676doi:https://doi.org/10.1115/DETC2010-28524
IDETC-CIE 2010; 677-682doi:https://doi.org/10.1115/DETC2010-28757
IDETC-CIE 2010; 683-689doi:https://doi.org/10.1115/DETC2010-28893
IDETC-CIE 2010; 691-701doi:https://doi.org/10.1115/DETC2010-28921
IDETC-CIE 2010; 703-711doi:https://doi.org/10.1115/DETC2010-29046
IDETC-CIE 2010; 713-723doi:https://doi.org/10.1115/DETC2010-29180
IDETC-CIE 2010; 725-732doi:https://doi.org/10.1115/DETC2010-29222

Measurement and Control in Micro and Nanosystems

IDETC-CIE 2010; 733-741doi:https://doi.org/10.1115/DETC2010-28253
IDETC-CIE 2010; 743-752doi:https://doi.org/10.1115/DETC2010-28280
IDETC-CIE 2010; 753-758doi:https://doi.org/10.1115/DETC2010-28299
IDETC-CIE 2010; 759-766doi:https://doi.org/10.1115/DETC2010-28533
IDETC-CIE 2010; 767-775doi:https://doi.org/10.1115/DETC2010-28735
IDETC-CIE 2010; 777-784doi:https://doi.org/10.1115/DETC2010-28956
IDETC-CIE 2010; 785-793doi:https://doi.org/10.1115/DETC2010-29036
IDETC-CIE 2010; 795-801doi:https://doi.org/10.1115/DETC2010-29177

Micro- and Nano- Manufacturing

IDETC-CIE 2010; 803-809doi:https://doi.org/10.1115/DETC2010-28648
IDETC-CIE 2010; 811-818doi:https://doi.org/10.1115/DETC2010-28703
IDETC-CIE 2010; 819-826doi:https://doi.org/10.1115/DETC2010-28777
IDETC-CIE 2010; 827-832doi:https://doi.org/10.1115/DETC2010-28946

Micro and Nanomechanisms and Robotics

IDETC-CIE 2010; 833-840doi:https://doi.org/10.1115/DETC2010-28336
IDETC-CIE 2010; 841-850doi:https://doi.org/10.1115/DETC2010-28370
IDETC-CIE 2010; 851-856doi:https://doi.org/10.1115/DETC2010-28948
IDETC-CIE 2010; 857-862doi:https://doi.org/10.1115/DETC2010-28973
IDETC-CIE 2010; 863-872doi:https://doi.org/10.1115/DETC2010-29011
IDETC-CIE 2010; 873-879doi:https://doi.org/10.1115/DETC2010-29213
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