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Proceedings Papers

Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems

20th International Conference on Design Theory and Methodology (DTM)

Analogies in Design

IDETC-CIE 2008; 11-19doi:https://doi.org/10.1115/DETC2008-49293
IDETC-CIE 2008; 21-32doi:https://doi.org/10.1115/DETC2008-49317
IDETC-CIE 2008; 33-44doi:https://doi.org/10.1115/DETC2008-49331
Topics: Design

Application of Modular Design

IDETC-CIE 2008; 45-53doi:https://doi.org/10.1115/DETC2008-49023
IDETC-CIE 2008; 55-66doi:https://doi.org/10.1115/DETC2008-49526
IDETC-CIE 2008; 67-76doi:https://doi.org/10.1115/DETC2008-49815
IDETC-CIE 2008; 77-86doi:https://doi.org/10.1115/DETC2008-49901
IDETC-CIE 2008; 87-96doi:https://doi.org/10.1115/DETC2008-49905

Artificial Intelligence in Design

IDETC-CIE 2008; 97-106doi:https://doi.org/10.1115/DETC2008-49147
IDETC-CIE 2008; 107-118doi:https://doi.org/10.1115/DETC2008-49366
IDETC-CIE 2008; 119-127doi:https://doi.org/10.1115/DETC2008-49853
IDETC-CIE 2008; 129-136doi:https://doi.org/10.1115/DETC2008-50102

Creativity and Biological Models in Design

IDETC-CIE 2008; 137-148doi:https://doi.org/10.1115/DETC2008-49363
IDETC-CIE 2008; 149-159doi:https://doi.org/10.1115/DETC2008-49372
IDETC-CIE 2008; 161-170doi:https://doi.org/10.1115/DETC2008-49672
IDETC-CIE 2008; 171-182doi:https://doi.org/10.1115/DETC2008-50035

DTM’s 20 Years: Reminisce, Reflect, Move Ahead

IDETC-CIE 2008; 183-192doi:https://doi.org/10.1115/DETC2008-49373

Flexibility and Reuse in Design

IDETC-CIE 2008; 193-202doi:https://doi.org/10.1115/DETC2008-49338
IDETC-CIE 2008; 203-216doi:https://doi.org/10.1115/DETC2008-49343
IDETC-CIE 2008; 217-230doi:https://doi.org/10.1115/DETC2008-49370
IDETC-CIE 2008; 231-244doi:https://doi.org/10.1115/DETC2008-49406

Functional Representations in Design

IDETC-CIE 2008; 245-254doi:https://doi.org/10.1115/DETC2008-49315
IDETC-CIE 2008; 255-263doi:https://doi.org/10.1115/DETC2008-49342
IDETC-CIE 2008; 265-272doi:https://doi.org/10.1115/DETC2008-49349
IDETC-CIE 2008; 273-286doi:https://doi.org/10.1115/DETC2008-49369

Metrics and Modular Design

IDETC-CIE 2008; 287-296doi:https://doi.org/10.1115/DETC2008-49140
IDETC-CIE 2008; 297-307doi:https://doi.org/10.1115/DETC2008-49860
IDETC-CIE 2008; 309-321doi:https://doi.org/10.1115/DETC2008-49963
Topics: Design
IDETC-CIE 2008; 323-332doi:https://doi.org/10.1115/DETC2008-50064

Product Architecture Design Methods

IDETC-CIE 2008; 333-342doi:https://doi.org/10.1115/DETC2008-49116
IDETC-CIE 2008; 343-353doi:https://doi.org/10.1115/DETC2008-49380
IDETC-CIE 2008; 355-363doi:https://doi.org/10.1115/DETC2008-49666
IDETC-CIE 2008; 365-376doi:https://doi.org/10.1115/DETC2008-49713
IDETC-CIE 2008; 377-385doi:https://doi.org/10.1115/DETC2008-49722

Representing Qualitative Aspects of Design

IDETC-CIE 2008; 387-395doi:https://doi.org/10.1115/DETC2008-49290
IDETC-CIE 2008; 397-407doi:https://doi.org/10.1115/DETC2008-49295
IDETC-CIE 2008; 409-420doi:https://doi.org/10.1115/DETC2008-49383
IDETC-CIE 2008; 421-427doi:https://doi.org/10.1115/DETC2008-50103

Risk, Complexity and Decision Making

IDETC-CIE 2008; 429-436doi:https://doi.org/10.1115/DETC2008-49266
IDETC-CIE 2008; 437-447doi:https://doi.org/10.1115/DETC2008-49347
IDETC-CIE 2008; 449-456doi:https://doi.org/10.1115/DETC2008-49350
IDETC-CIE 2008; 457-467doi:https://doi.org/10.1115/DETC2008-49359

Widely Applicable Techniques for Improving Design Practice in Industry

IDETC-CIE 2008; 469-479doi:https://doi.org/10.1115/DETC2008-49360
IDETC-CIE 2008; 481-493doi:https://doi.org/10.1115/DETC2008-49361
IDETC-CIE 2008; 495-503doi:https://doi.org/10.1115/DETC2008-49980
Topics: Design
IDETC-CIE 2008; 505-514doi:https://doi.org/10.1115/DETC2008-50107

2nd International Conference on Micro- and Nanosystems (MNS)

Applied Mechanics, Friction, Tribology in MEMS/NEMS

IDETC-CIE 2008; 517-521doi:https://doi.org/10.1115/DETC2008-49238
IDETC-CIE 2008; 523-527doi:https://doi.org/10.1115/DETC2008-49461
IDETC-CIE 2008; 529-533doi:https://doi.org/10.1115/DETC2008-49507
IDETC-CIE 2008; 535-538doi:https://doi.org/10.1115/DETC2008-49818
IDETC-CIE 2008; 539-542doi:https://doi.org/10.1115/DETC2008-49821
IDETC-CIE 2008; 543-545doi:https://doi.org/10.1115/DETC2008-49842
IDETC-CIE 2008; 547-552doi:https://doi.org/10.1115/DETC2008-49897
IDETC-CIE 2008; 553-559doi:https://doi.org/10.1115/DETC2008-49911
IDETC-CIE 2008; 561-568doi:https://doi.org/10.1115/DETC2008-49949
IDETC-CIE 2008; 569-572doi:https://doi.org/10.1115/DETC2008-50077
IDETC-CIE 2008; 573-580doi:https://doi.org/10.1115/DETC2008-50143

Micro and Nano Scale Sensors and Actuators

IDETC-CIE 2008; 581-587doi:https://doi.org/10.1115/DETC2008-49178
IDETC-CIE 2008; 589-592doi:https://doi.org/10.1115/DETC2008-49545
IDETC-CIE 2008; 593-597doi:https://doi.org/10.1115/DETC2008-49594
IDETC-CIE 2008; 599-604doi:https://doi.org/10.1115/DETC2008-49843
IDETC-CIE 2008; 605-611doi:https://doi.org/10.1115/DETC2008-50122

MNS Poster Session

IDETC-CIE 2008; 613-617doi:https://doi.org/10.1115/DETC2008-49283
IDETC-CIE 2008; 619-628doi:https://doi.org/10.1115/DETC2008-49525
IDETC-CIE 2008; 629-631doi:https://doi.org/10.1115/DETC2008-49543
IDETC-CIE 2008; 633-640doi:https://doi.org/10.1115/DETC2008-49546
IDETC-CIE 2008; 641-646doi:https://doi.org/10.1115/DETC2008-49731
IDETC-CIE 2008; 647-654doi:https://doi.org/10.1115/DETC2008-49792
IDETC-CIE 2008; 655-661doi:https://doi.org/10.1115/DETC2008-50002
IDETC-CIE 2008; 663-667doi:https://doi.org/10.1115/DETC2008-50019
IDETC-CIE 2008; 669-675doi:https://doi.org/10.1115/DETC2008-50076
IDETC-CIE 2008; 677-682doi:https://doi.org/10.1115/DETC2008-50134

Nano-Imprint Technology

IDETC-CIE 2008; 683-687doi:https://doi.org/10.1115/DETC2008-49260
IDETC-CIE 2008; 689-693doi:https://doi.org/10.1115/DETC2008-49647
IDETC-CIE 2008; 695-700doi:https://doi.org/10.1115/DETC2008-49766
IDETC-CIE 2008; 701-711doi:https://doi.org/10.1115/DETC2008-50114

Symposium on Bio-MEMS and Bio-NEMS

IDETC-CIE 2008; 713-718doi:https://doi.org/10.1115/DETC2008-49182
IDETC-CIE 2008; 719-722doi:https://doi.org/10.1115/DETC2008-49503
IDETC-CIE 2008; 723-730doi:https://doi.org/10.1115/DETC2008-49548
IDETC-CIE 2008; 731-736doi:https://doi.org/10.1115/DETC2008-49699

Symposium on Measurement and Control of Micro- and Nano-Systems

IDETC-CIE 2008; 737-741doi:https://doi.org/10.1115/DETC2008-49555
IDETC-CIE 2008; 743-747doi:https://doi.org/10.1115/DETC2008-49846
IDETC-CIE 2008; 749-757doi:https://doi.org/10.1115/DETC2008-49877
IDETC-CIE 2008; 759-764doi:https://doi.org/10.1115/DETC2008-49884
IDETC-CIE 2008; 765-774doi:https://doi.org/10.1115/DETC2008-49931
IDETC-CIE 2008; 775-781doi:https://doi.org/10.1115/DETC2008-50020
IDETC-CIE 2008; 783-787doi:https://doi.org/10.1115/DETC2008-50067

Symposium on Micro- and Nano-Manipulation

IDETC-CIE 2008; 789-797doi:https://doi.org/10.1115/DETC2008-49232
IDETC-CIE 2008; 799-801doi:https://doi.org/10.1115/DETC2008-49540
IDETC-CIE 2008; 803-810doi:https://doi.org/10.1115/DETC2008-49640
IDETC-CIE 2008; 811-817doi:https://doi.org/10.1115/DETC2008-50026

Symposium on Micro- Nanodevices and Applications

IDETC-CIE 2008; 819-824doi:https://doi.org/10.1115/DETC2008-49270
IDETC-CIE 2008; 825-830doi:https://doi.org/10.1115/DETC2008-49272
IDETC-CIE 2008; 831-837doi:https://doi.org/10.1115/DETC2008-49492
IDETC-CIE 2008; 839-847doi:https://doi.org/10.1115/DETC2008-49825
IDETC-CIE 2008; 849-853doi:https://doi.org/10.1115/DETC2008-50115

Symposium on the Design Issues in Micro/Nano Systems

IDETC-CIE 2008; 855-864doi:https://doi.org/10.1115/DETC2008-49184
IDETC-CIE 2008; 865-870doi:https://doi.org/10.1115/DETC2008-49214
IDETC-CIE 2008; 871-878doi:https://doi.org/10.1115/DETC2008-49470
IDETC-CIE 2008; 879-886doi:https://doi.org/10.1115/DETC2008-49487
IDETC-CIE 2008; 887-894doi:https://doi.org/10.1115/DETC2008-49600
IDETC-CIE 2008; 895-903doi:https://doi.org/10.1115/DETC2008-49617
IDETC-CIE 2008; 905-908doi:https://doi.org/10.1115/DETC2008-49819
IDETC-CIE 2008; 909-914doi:https://doi.org/10.1115/DETC2008-49886
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