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Proceedings Papers

ASME 2004 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 28–October 2, 2004
Salt Lake City, Utah, USA
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4695-4
In This Volume
Volume 2: 28th Biennial Mechanisms and Robotics Conference, Parts A and B

28th Biennial Mechanisms and Robotics Conference

IDETC-CIE 2004; 7-12doi:https://doi.org/10.1115/DETC2004-57009
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IDETC-CIE 2004; 105-114doi:https://doi.org/10.1115/DETC2004-57035
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IDETC-CIE 2004; 307-315doi:https://doi.org/10.1115/DETC2004-57124
Topics: Linkages
IDETC-CIE 2004; 317-325doi:https://doi.org/10.1115/DETC2004-57125
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IDETC-CIE 2004; 523-533doi:https://doi.org/10.1115/DETC2004-57188
IDETC-CIE 2004; 535-540doi:https://doi.org/10.1115/DETC2004-57189
IDETC-CIE 2004; 541-548doi:https://doi.org/10.1115/DETC2004-57190
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IDETC-CIE 2004; 561-570doi:https://doi.org/10.1115/DETC2004-57193
IDETC-CIE 2004; 571-575doi:https://doi.org/10.1115/DETC2004-57196
IDETC-CIE 2004; 577-587doi:https://doi.org/10.1115/DETC2004-57206
IDETC-CIE 2004; 589-594doi:https://doi.org/10.1115/DETC2004-57215
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IDETC-CIE 2004; 603-610doi:https://doi.org/10.1115/DETC2004-57230
IDETC-CIE 2004; 611-620doi:https://doi.org/10.1115/DETC2004-57232
IDETC-CIE 2004; 621-626doi:https://doi.org/10.1115/DETC2004-57234
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IDETC-CIE 2004; 635-643doi:https://doi.org/10.1115/DETC2004-57242
IDETC-CIE 2004; 645-658doi:https://doi.org/10.1115/DETC2004-57243
IDETC-CIE 2004; 659-667doi:https://doi.org/10.1115/DETC2004-57246
IDETC-CIE 2004; 669-677doi:https://doi.org/10.1115/DETC2004-57247
Topics: Proteins
IDETC-CIE 2004; 679-688doi:https://doi.org/10.1115/DETC2004-57251
IDETC-CIE 2004; 689-698doi:https://doi.org/10.1115/DETC2004-57264
IDETC-CIE 2004; 699-708doi:https://doi.org/10.1115/DETC2004-57268
IDETC-CIE 2004; 709-716doi:https://doi.org/10.1115/DETC2004-57272
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IDETC-CIE 2004; 727-731doi:https://doi.org/10.1115/DETC2004-57276
IDETC-CIE 2004; 733-742doi:https://doi.org/10.1115/DETC2004-57281
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IDETC-CIE 2004; 749-754doi:https://doi.org/10.1115/DETC2004-57286
IDETC-CIE 2004; 755-762doi:https://doi.org/10.1115/DETC2004-57293
IDETC-CIE 2004; 763-772doi:https://doi.org/10.1115/DETC2004-57294
IDETC-CIE 2004; 773-779doi:https://doi.org/10.1115/DETC2004-57295
IDETC-CIE 2004; 781-788doi:https://doi.org/10.1115/DETC2004-57296
IDETC-CIE 2004; 789-797doi:https://doi.org/10.1115/DETC2004-57315
IDETC-CIE 2004; 799-808doi:https://doi.org/10.1115/DETC2004-57317
IDETC-CIE 2004; 809-817doi:https://doi.org/10.1115/DETC2004-57318
IDETC-CIE 2004; 819-830doi:https://doi.org/10.1115/DETC2004-57322
IDETC-CIE 2004; 831-840doi:https://doi.org/10.1115/DETC2004-57323
IDETC-CIE 2004; 841-849doi:https://doi.org/10.1115/DETC2004-57324
IDETC-CIE 2004; 851-858doi:https://doi.org/10.1115/DETC2004-57325
IDETC-CIE 2004; 859-865doi:https://doi.org/10.1115/DETC2004-57326
IDETC-CIE 2004; 867-874doi:https://doi.org/10.1115/DETC2004-57330
IDETC-CIE 2004; 875-883doi:https://doi.org/10.1115/DETC2004-57340
Topics: Sensors
IDETC-CIE 2004; 885-891doi:https://doi.org/10.1115/DETC2004-57341
IDETC-CIE 2004; 893-900doi:https://doi.org/10.1115/DETC2004-57343
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IDETC-CIE 2004; 909-914doi:https://doi.org/10.1115/DETC2004-57354
IDETC-CIE 2004; 915-922doi:https://doi.org/10.1115/DETC2004-57362
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IDETC-CIE 2004; 935-942doi:https://doi.org/10.1115/DETC2004-57375
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IDETC-CIE 2004; 1381-1388doi:https://doi.org/10.1115/DETC2004-57541
IDETC-CIE 2004; 1389-1394doi:https://doi.org/10.1115/DETC2004-57549
IDETC-CIE 2004; 1395-1406doi:https://doi.org/10.1115/DETC2004-57553
IDETC-CIE 2004; 1407-1418doi:https://doi.org/10.1115/DETC2004-57554
IDETC-CIE 2004; 1419-1426doi:https://doi.org/10.1115/DETC2004-57557
IDETC-CIE 2004; 1427-1434doi:https://doi.org/10.1115/DETC2004-57559
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IDETC-CIE 2004; 1503-1511doi:https://doi.org/10.1115/DETC2004-57579
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IDETC-CIE 2004; 1605-1615doi:https://doi.org/10.1115/DETC2004-57630
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