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Justin R. Serrano
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Journal Articles

Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges

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Timothy S. English, Leslie M. Phinney, Patrick E. Hopkins, Justin R. Serrano
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research-Article
J. Heat Mass Transfer. September 2013, 135(9): 091103.
Paper No: HT-12-1408
https://doi.org/10.1115/1.4024357
Published Online: July 26, 2013
View Articletitled, Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges
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Topics: Silicon, Temperature, Thermal conductivity, Crystals, Mean free path, Phonons
Journal Articles

Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model

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Patrick E. Hopkins, Leslie M. Phinney, Justin R. Serrano
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Briefs
J. Heat Mass Transfer. April 2011, 133(4): 044505.
https://doi.org/10.1115/1.4002778
Published Online: January 14, 2011
View Articletitled, Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model
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Topics: Electrons, Relaxation (Physics), Thermoreflectance, Electron emission, Thin films
Journal Articles

Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating

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Patrick E. Hopkins, Justin R. Serrano, Leslie M. Phinney, Sean P. Kearney, Thomas W. Grasser, C. Thomas Harris
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2010, 132(8): 081302.
https://doi.org/10.1115/1.4000993
Published Online: May 20, 2010
View Articletitled, Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating
Open the PDF for Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating in another window
Topics: Electrical conductance, Heating, Lasers, Probes, Pumps, Thermal conductivity, Thermoreflectance, Thin films, Top-tensioned risers, Heat conduction
Journal Articles

Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr

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Leslie M. Phinney, Justin R. Serrano, Edward S. Piekos, John R. Torczynski, Michael A. Gallis, Allen D. Gorby
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. July 2010, 132(7): 072402.
https://doi.org/10.1115/1.4000965
Published Online: April 28, 2010
View Articletitled, Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr
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Topics: Bridges (Structures), Finite element analysis, Heat transfer, Microelectromechanical systems, Pressure, Simulation, Temperature, Temperature measurement, Heat conduction, Temperature profiles
Journal Articles

Time-Resolved Micro-Raman Thermometry for Microsystems in Motion

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Justin R. Serrano, Sean P. Kearney
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. December 2008, 130(12): 122401.
https://doi.org/10.1115/1.2976552
Published Online: September 16, 2008
View Articletitled, Time-Resolved Micro-Raman Thermometry for Microsystems in Motion
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Topics: Actuators, Microelectromechanical systems, Temperature, Temperature measurement, Signals, Lasers, Probes
Journal Articles

Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress

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Mark R. Abel, Samuel Graham, Justin R. Serrano, Sean P. Kearney, Leslie M. Phinney
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. March 2007, 129(3): 329–334.
https://doi.org/10.1115/1.2409996
Published Online: May 31, 2006
View Articletitled, Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress
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Topics: Calibration, Polysilicon, Spectral linewidth, Stress, Temperature, Temperature measurement, Uncertainty, Thermal stresses, Raman spectroscopy, Microelectromechanical systems