Thermal interface materials (TIMs) have reached values approaching the measurement uncertainty of standard ASTM D5470 based testers of approximately ±1 × 10−6 m2 K/W. This paper presents a miniature ASTM-type steady-state tester that was developed to address the resolution limits of standard testers by reducing the heat meter bar thickness and using infrared (IR) thermography to measure the temperature gradient along the heat meter bar. Thermal interfacial resistance measurements on the order of 1 × 10−6 m2 K/W with an order of magnitude improvement in the uncertainty of ±1 × 10−7 m2 K/W are demonstrated. These measurements were made on several TIMs with a thermal resistance as low as 1.14 × 10−6 m2 K/W.
Measurement of High-Performance Thermal Interfaces Using a Reduced Scale Steady-State Tester and Infrared Microscopy
Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received March 16, 2015; final manuscript received September 30, 2015; published online January 20, 2016. Assoc. Editor: Laurent Pilon.
This material is declared a work of the U.S. Government and is not subject to copyright protection in the United States. Approved for public release; distribution is unlimited.
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Smith, A. N., Jankowski, N. R., and Boteler, L. M. (January 20, 2016). "Measurement of High-Performance Thermal Interfaces Using a Reduced Scale Steady-State Tester and Infrared Microscopy." ASME. J. Heat Transfer. April 2016; 138(4): 041301. https://doi.org/10.1115/1.4032172
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