SiGe alloys represent an important type of high-temperature semiconductor material for solid-state energy conversion. In the present study, the near-field radiative heat transfer between heavily doped SiGe plates is investigated. A dielectric function model is formulated based on the previously reported room-temperature mobility and temperature-dependent electric resistivity of several silicon-rich alloys with different doping type and concentration. Fluctuational electrodynamics is used to evaluate the near-field noncontact heat transfer coefficient. The variation of the heat transfer coefficient with doping concentration and temperature is explained according to the change in the optical constants and in the spectral distribution of the near-field heat flux.
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e-mail: zhuomin.zhang@me.gatech.edu
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September 2012
This article was originally published in
Journal of Heat Transfer
Radiative Heat Transfer
Near-Field Radiative Transfer Between Heavily Doped SiGe at Elevated Temperatures
Z. M. Zhang,
Z. M. Zhang
Fellow ASME
George W. Woodruff School of Mechanical Engineering,
e-mail: zhuomin.zhang@me.gatech.edu
Georgia Institute of Technology
, Atlanta, GA 30332
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E. T. Enikov,
E. T. Enikov
Department of Aerospace and Mechanical Engineering,
University of Arizona
, Tucson, AZ 85721
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T. Makansi
T. Makansi
Tempronics, Inc., Tucson, AZ 85750
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Z. M. Zhang
Fellow ASME
George W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology
, Atlanta, GA 30332e-mail: zhuomin.zhang@me.gatech.edu
E. T. Enikov
Department of Aerospace and Mechanical Engineering,
University of Arizona
, Tucson, AZ 85721
T. Makansi
Tempronics, Inc., Tucson, AZ 85750
J. Heat Transfer. Sep 2012, 134(9): 092702 (7 pages)
Published Online: July 9, 2012
Article history
Received:
July 28, 2011
Revised:
January 23, 2012
Online:
July 9, 2012
Published:
July 9, 2012
Citation
Zhang, Z. M., Enikov, E. T., and Makansi, T. (July 9, 2012). "Near-Field Radiative Transfer Between Heavily Doped SiGe at Elevated Temperatures." ASME. J. Heat Transfer. September 2012; 134(9): 092702. https://doi.org/10.1115/1.4006168
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