We have developed a nanofabricated resistance thermometer device to measure the thermal conductivity of graphene monolayers exfoliated onto silicon dioxide. The measurement results show that the thermal conductivity of the supported graphene is approximately at room temperature. While this value is lower than the reported basal plane values for graphite and suspended graphene because of phonon leakage across the graphene-support interface, it is still considerably higher than the values for common thin film electronic materials. Here, we present a detailed discussion of the design and fabrication of the measurement device. Analytical and numerical heat transfer solutions are developed to evaluate the accuracy and uncertainty of this method for thermal conductivity measurement of high-thermal conductivity ultrathin films.
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Research Papers
Thermal Conductivity Measurement of Graphene Exfoliated on Silicon Dioxide
Jae Hun Seol,
Jae Hun Seol
Department of Mechanical Engineering,
University of Texas at Austin
, Austin, TX 78712
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Arden L. Moore,
Arden L. Moore
Department of Mechanical Engineering,
University of Texas at Austin
, Austin, TX 78712
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Li Shi,
Li Shi
Department of Mechanical Engineering,
e-mail: lishi@mail.utexas.edu
University of Texas at Austin
, Austin, TX 78712
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Insun Jo,
Insun Jo
Department of Physics,
University of Texas at Austin
, Austin, TX 78712
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Zhen Yao
Zhen Yao
Department of Physics,
University of Texas at Austin
, Austin, TX 78712
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Jae Hun Seol
Department of Mechanical Engineering,
University of Texas at Austin
, Austin, TX 78712
Arden L. Moore
Department of Mechanical Engineering,
University of Texas at Austin
, Austin, TX 78712
Li Shi
Department of Mechanical Engineering,
University of Texas at Austin
, Austin, TX 78712e-mail: lishi@mail.utexas.edu
Insun Jo
Department of Physics,
University of Texas at Austin
, Austin, TX 78712
Zhen Yao
Department of Physics,
University of Texas at Austin
, Austin, TX 78712J. Heat Transfer. Feb 2011, 133(2): 022403 (7 pages)
Published Online: November 3, 2010
Article history
Received:
April 29, 2010
Revised:
August 27, 2010
Online:
November 3, 2010
Published:
November 3, 2010
Citation
Seol, J. H., Moore, A. L., Shi, L., Jo, I., and Yao, Z. (November 3, 2010). "Thermal Conductivity Measurement of Graphene Exfoliated on Silicon Dioxide." ASME. J. Heat Transfer. February 2011; 133(2): 022403. https://doi.org/10.1115/1.4002608
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