The transient thermoreflectance (TTR) method consists of measuring changes in the reflectivity of a material (thin film) under pulsed laser heating, and relating these changes to the corresponding surface temperature variations. Analytical solutions of the diffusion problem are then used to determine the thermal conductivity of the material following an iterative matching process between the solutions and the experimental results. Analytical solutions are attainable either when the material absorbs the laser energy volumetrically or when the material absorbs the laser energy at the surface. Either solution allows for the determination of only one thermal property (thermal conductivity or diffusivity), with the other one assumed to be known. A new, single, analytical solution to the transient diffusion equation with simultaneous surface and volumetric heating, found using fractional calculus, is presented in a semi-derivative form. This complete solution provides the means to determine the two thermal properties of the material (thermal conductivity and diffusivity) concomitantly. In this preliminary study, the solution component for surface heating is validated by comparison with experimental data for a gold sample using the classical thermoreflectance method. Further results, for surface and volumetric heating, are obtained and analyzed considering a GaAs sample.

Issue Section:
Microscale Heat Transfer
Keywords:
thin films, thermal conductivity, thermal diffusivity, laser beam effects, thermoreflectance, gallium arsenide, Analytical, Heat Transfer, Laser, Measurement Techniques, Thin Films
Topics:
Diffusion (Physics), Gallium arsenide, Heating, Lasers, Temperature, Thermal conductivity, Thermal properties, Thermoreflectance, Thin films, Transients (Dynamics), Top-tensioned risers, Laser beams, Heat flux, Heat, Reflectance
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Copyright © 2001
 by ASME
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