This paper describes the experimental investigation of an upward annular air-water flow in a duct with a 6.35 mm by 63.5 mm rectangular cross section. The test section was instrumented to measure the film thickness and the interfacial wave velocity. Flush-wire electrical conductivity probes were used to obtain local film thickness measurement with a spatial resolution of 200 μm or better and a temporal resolution greater than 2 kHz. Measurements of the base films range from 50 μm to ∼325 μm (2% to 10% of half-channel thickness). Statistical analysis shows that the standard deviation of the film thickness is a good measure of the film roughness. The relative roughness and the nondimensional film thickness are correlated as functions of the phasic Reynolds number ratio, It is found that at the relative roughness is a maximum. A simple model developed by matching the interfacial shear in the two fluids, predicts the wave velocity data very well.
Film Thickness and Wave Velocity Measurements in a Vertical Duct
Contributed by the Fluids Engineering Division for publication in the JOURNAL OF FLUIDS ENGINEERING. Manuscript received by the Fluids Engineering Division February 14, 2001; revised manuscript received April 10, 2002. Associate Editor: J. Katz.
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Kumar, R., Gottmann , M., and Sridhar, K. R. (August 19, 2002). "Film Thickness and Wave Velocity Measurements in a Vertical Duct ." ASME. J. Fluids Eng. September 2002; 124(3): 634–642. https://doi.org/10.1115/1.1493808
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