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Journal Articles

Rapid Anneal-Free Welding of Cu Nanowires Network by Ultraviolet Light Irradiation for Transparent Electrodes in Optoelectronic Applications

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Jun Wang, Yang Zhao, Han Chen, Yan Tang, Guozhen Liu, Renli Liang, Jiangnan Dai, Changqing Chen, Junyong Kang, Duanjun Cai
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2020, 142(3): 031102.
Paper No: EP-19-1120
https://doi.org/10.1115/1.4046764
Published Online: April 17, 2020
View Articletitled, Rapid Anneal-Free Welding of Cu Nanowires Network by Ultraviolet Light Irradiation for Transparent Electrodes in Optoelectronic Applications
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Topics: Electrodes, Irradiation (Radiation exposure), Nanowires, Transparency, Ultraviolet radiation, Light-emitting diodes, Welding
Journal Articles

Study on BEOL Failures in a Chip by Shear Tests of Copper Pillar Bumps

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Lei Wang, Jun Wang, Fei Xiao
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2019, 141(1): 011003.
Paper No: EP-18-1037
https://doi.org/10.1115/1.4041714
Published Online: February 25, 2019
View Articletitled, Study on BEOL Failures in a Chip by Shear Tests of Copper Pillar Bumps
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Topics: Columns (Structural), Copper, Shear (Mechanics), Stress, Failure, Finite element analysis, Failure mechanisms
Journal Articles

Reliability Assessment of Wafer Level Packages With Novel FeNi Under Bump Metallization

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Jia Xi, Xinduo Zhai, Jun Wang, Donglun Yang, Mao Ru, Fei Xiao, Li Zhang, Chi Ming Lai
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2015, 137(3): 031016.
Paper No: EP-15-1016
https://doi.org/10.1115/1.4030974
Published Online: July 21, 2015
View Articletitled, Reliability Assessment of Wafer Level Packages With Novel FeNi Under Bump Metallization
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Topics: Ferronickel, Finite element analysis, Reliability, Semiconductor wafers, Solders, Temperature, Fracture (Materials), Failure mechanisms, Alloys, Stress