Skip Nav Destination
Issues
September 1994
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Critical Accumulated Strain Energy (Case) Failure Criterion for Thermal Cycling Fatigue of Solder Joints
J. Electron. Packag. September 1994, 116(3): 163–170.
doi: https://doi.org/10.1115/1.2905681
Topics:
Failure
,
Fatigue
,
Solder joints
,
Creep
,
Fatigue life
,
Cycles
,
Density
,
Computers
,
Crack propagation
,
Design
Approximate Evaluation of the Elastic Thermal Stresses in a Thin Film Fabricated on a Very Thick Circular Substrate
J. Electron. Packag. September 1994, 116(3): 171–176.
doi: https://doi.org/10.1115/1.2905682
Topics:
Thermal stresses
,
Thin films
Moire´ Interferometry Analysis of Laser Weld Induced Thermal Strain
J. Electron. Packag. September 1994, 116(3): 177–183.
doi: https://doi.org/10.1115/1.2905683
Failure Analysis of No-Clean and Water-Clean Solder Joints 0.4 mm Pitch, 256-Pin Plastic Quad Flat Pack
J. Electron. Packag. September 1994, 116(3): 184–190.
doi: https://doi.org/10.1115/1.2905684
Topics:
Failure analysis
,
Solder joints
,
Water
,
Solders
,
Cycles
,
Crack propagation
,
Cracking (Materials)
,
Failure
,
Failure mechanisms
,
Fatigue damage
Influence of Polymer Viscoelasticity on a Bending Bilayer
J. Electron. Packag. September 1994, 116(3): 191–197.
doi: https://doi.org/10.1115/1.2905685
Effects of Substrate Conductivity on Convective Cooling of Electronic Components
J. Electron. Packag. September 1994, 116(3): 198–205.
doi: https://doi.org/10.1115/1.2905686
Topics:
Cooling
,
Electrical conductivity
,
Electronic components
,
Thermal conductivity
,
Heat conduction
,
Fluids
,
Heat
,
Temperature
,
Boundary-value problems
,
Convection
Effect of Flow Bypass on the Performance of Longitudinal Fin Heat Sinks
J. Electron. Packag. September 1994, 116(3): 206–211.
doi: https://doi.org/10.1115/1.2905687
Topics:
Flow (Dynamics)
,
Heat sinks
,
Heat transfer
,
Coolants
,
Cooling
,
Design
,
Electronic packages
,
Forced convection
Fixed Wand Electronic Flame-Off for Ball Formation in the Wire Bonding Process
J. Electron. Packag. September 1994, 116(3): 212–219.
doi: https://doi.org/10.1115/1.2905688
Topics:
Flames
,
Wire bonding
,
Wire
,
Electrodes
,
Design
,
Computation
,
Computer simulation
,
Cycles
,
Deflection
,
Electric fields
A Multi-Kilowatt Immersion-Cooled Standard Electronic Clamshell Module for Future Aircraft Avionics
J. Electron. Packag. September 1994, 116(3): 220–229.
doi: https://doi.org/10.1115/1.2905689
Topics:
Aircraft
,
Avionics
,
Coolants
,
Flow (Dynamics)
,
Pressure drop
,
Subcooling
,
Cooling
,
Heat
,
Military systems
,
Printed circuit boards
Heat Conduction in Concentric Cylinders: An Application to Electronic Packages
J. Electron. Packag. September 1994, 116(3): 230–233.
doi: https://doi.org/10.1115/1.2905690
Topics:
Cylinders
,
Electronic packages
,
Heat conduction
,
Heat
,
Thermal conductivity
,
Aluminum
,
Copper
,
Dielectric materials
,
Dimensions
,
Electronic equipment
Technical Briefs
Advantages and Disadvantages of Thin Small Outline Packages (TSOP) With Copper Gull-Wing Leads
J. Electron. Packag. September 1994, 116(3): 234–237.
doi: https://doi.org/10.1115/1.2905691
Topics:
Copper
,
Wings
,
Alloys
,
Manufacturing
,
Solder joints
,
Stress
Thermofluid Design of Single-Phase Submerged-Jet Impingement Cooling for Electronic Components
J. Electron. Packag. September 1994, 116(3): 237–240.
doi: https://doi.org/10.1115/1.2905692
Topics:
Design
,
Electronic components
,
Impingement cooling
,
Thermofluids
Email alerts
RSS Feeds
A Review of the Cu Chemical Mechanical Planarization Process in Hybrid Bonding Technology
J. Electron. Packag (September 2025)
The Impact of Die Tilt on the Reliability of Packages With Dies Bonded to Substrates Using Silver Sintered Material
J. Electron. Packag (September 2025)
On the Assumption Used for the Time-Dependent Warpage Analysis of Encapsulated Semiconductor Packages
J. Electron. Packag (September 2025)
Three Decades of Thermal Management Research at DARPA
J. Electron. Packag