Abstract

The microstructure transformation, mechanical properties, and fracture behavior of boron (B) decorated tin (Sn)-1.5%Ag-0.7%copper (Cu) (SAC157) solder joints with Cu pillars were analyzed. Three concentrations of B (0.015%, 0.020%, and 0.025%) were evenly mixed into the SAC157 solders. The addition of B refined the primary β-Sn phase and transformed the eutectic phase Ag3Sn from a plate-like structure to a dense stripe configuration. During high-temperature storage, coarse intermetallic compounds (IMCs) that extruded into the primary β-Sn in SAC157 solder were observed, and the growth of IMCs was inhibited by B-pinning boundary motion. Furthermore, the B additive simultaneously increased hardness and improved ductility by reducing grain size. In shear strength tests, the SAC157 solder exhibited a brittle fracture surface with a shorter displacement of 0.78 mm, compared to 1.2 mm of elongation in B-decorated SAC157 solders, which displayed ductile properties characterized by a dimpled fracture surface. In conclusion, B particles acted as heterogeneous nucleation sites, effectively refining the grain structure, inhibiting the growth of the eutectic phase, and simultaneously enhancing ductility without compromising hardness.

References

1.
Liu
,
C. Y.
,
Chen
,
C.
, and
Tu
,
K. N.
,
2000
, “
Electromigration in Sn–Pb Solder Strips as a Function of Alloy Composition
,”
J. Appl. Phys.
,
88
(
10
), pp.
5703
5709
.10.1063/1.1319327
2.
Tu
,
K. N.
, and
Zeng
,
K.
,
2001
, “
Tin-Lead (SnPb) Solder Reaction in Flip Chip Technology
,”
Mater. Sci. Eng.
,
34
(
1
), pp.
1
58
.10.1016/S0927-796X(01)00029-8
3.
Qi
,
Y.
,
Lam
,
R.
,
Ghorbani
,
H. R.
,
Snugovsky
,
P.
, and
Spelt
,
J. K.
,
2006
, “
Temperature Profile Effects in Accelerated Thermal Cycling of SnPb and Pb-Free Solder Joints
,”
Microelectron. Reliab.
,
46
(
2–4
), pp.
574
588
.10.1016/j.microrel.2005.01.008
4.
Ho
,
C. Y.
,
Cheng
,
H.
,
Chang
,
Y. C.
, and
Lee
,
H. T.
,
2020
, “
Investigation of Various Bumps and Redistribution Lines to Inhibit Protected Silicon Nitride Cracks in High Pattern Density Chip Package
,”
J. Electron. Mater.
,
49
(
9
), pp.
5613
5621
.10.1007/s11664-020-08310-8
5.
Choi
,
W. J.
,
Yeh
,
E. C. C.
, and
Tu
,
K. N.
,
2003
, “
Mean-Time-to-Failure Study of Flip Chip Solder Joints on Cu/Ni(V)/Al Thin-Film Under-Bump-Metallization
,”
J. Appl. Phys.
,
94
(
9
), pp.
5665
5671
.10.1063/1.1616993
6.
Kim
,
J. W.
,
Kim
,
D. G.
, and
Jung
,
S. B.
,
2006
, “
Evaluation of Displacement Rate Effect in Shear Test of Sn-3Ag-0.5Cu Solder Bump for Flip Chip Application
,”
Microelectron. Reliab.
,
46
(
2–4
), pp.
535
542
.10.1016/j.microrel.2005.06.008
7.
Huang
,
Z.
,
Kumar
,
P.
,
Dutta
,
I.
,
Pang
,
J. H. L.
,
Siduh
,
R.
,
Renavikar
,
M.
, and
Mahajan
,
R.
,
2012
, “
Fracture of Sn-Ag-Cu Solder Joints on Cu Substrates: I. Effects of Loading and Processing Conditions
,”
J. Electron. Mater.
,
41
, pp.
375
389
.10.1007/s11664-011-1769-8
8.
Suh
,
D. W.
,
Kim
,
D. W.
,
Liu
,
P.
,
Kim
,
H.
,
Weninger
,
J. A.
,
Kumar
,
C. M.
,
Prasad
,
A.
,
Grimsley
,
B. W.
, and
Tejada
,
H. B.
,
2007
, “
Effects of Ag Content on Fracture Resistance of Sn-Ag-Cu Lead-Free Solders Under High Strain Rate Conditions
,”
Mater. Sci. Eng. A
,
460–461
, pp.
595
603
.10.1016/j.msea.2007.01.145
9.
Xu
,
L. H.
,
Pang
,
J. H. L.
, and
Che
,
F.
,
2008
, “
Impact of Thermal Cycling on Sn-Ag-Cu Solder Joints and Board-Level Drop Reliability
,”
J. Electron. Mater.
,
37
(
6
), pp.
880
886
.10.1007/s11664-008-0400-0
10.
Lee
,
T. K.
,
Xie
,
W. D.
,
Zhou
,
B.
,
Bieler
,
T.
, and
Liu
,
K. C.
,
2011
, “
Impact of Isothermal Aging on Long-Term Reliability of Fine-Pitch Ball Grid Array Packages With Sn-Ag-Cu Solder Interconnects: Die Size Effects
,”
J. Electron. Mater.
,
40
(
9
), pp.
1967
1976
.10.1007/s11664-011-1702-1
11.
Haseeb
,
A.
,
Arafat
,
M.
, and
Johan
,
M. R.
,
2012
, “
Stability of Molybdenum Nanoparticles in Sn–3.8 Ag–0.7 Cu Solder During Multiple Reflow and Their Influence on Interfacial Intermetallic Compounds
,”
Mater. Charact.
,
64
, pp.
27
35
.10.1016/j.matchar.2011.11.006
12.
Cook
,
B. A.
,
Anderson
,
I. E.
,
Harringa
,
J. L.
, and
Terpstra
,
R. L.
,
2001
, “
Effect of Heat Treatment on the Electrical Resistivity of Near-Eutectic Sn-Ag-Cu Pb-Free Solder Alloys
,”
J. Electron. Mater.
,
30
, pp.
1214
1221
.
13.
Lee
,
T. K.
,
Ma
,
H.
,
Liu
,
K. C.
, and
Xue
,
J.
,
2010
, “
Impact Testing of Sn-3.0Ag-0.5Cu Solder With Ti/Ni/(V)/Cu Under Bump Metallization After Aging at 150 °C
,”
J. Electron Mater.
,
39
, pp.
2564
273
.10.1007/s11664-010-1352-8
14.
Choi
,
H.
,
Lee
,
T. K.
,
Kim
,
Y.
,
Kwon
,
H.
,
Tseng
,
C. F.
,
Duh
,
J. G.
, and
Choe
,
H.
,
2012
, “
Improved Strength of Boron-Doped Sn-1.0 Ag-0.5 Cu Solder Joints Under Aging Conditions
,”
Intermetallics
,
20
(
1
), pp.
155
159
.10.1016/j.intermet.2011.09.008
15.
Ye
,
L.
,
Lai
,
Z.
,
Liu
,
J.
, and
Thölén
,
A.
,
2001
, “
Microstructure Investigation of Sn-0.5 Cu-3.5 Ag and Sn-3.5 Ag-0.5 Cu-0.5 B Lead-Free Solders
,”
Soldering Surf. Mount Technol.
,
13
, pp.
16
20
.10.1108/EUM0000000006025
16.
Qu
,
J. F.
,
Xu
,
J.
,
Hu
,
Q.
,
Zhang
,
F. W.
, and
Zhang
,
S. M.
,
2015
, “
Modification of Sn–1.0 Ag–0.5 Cu Solder Using Nickel and Boron
,”
Rare Met.
,
34
(
11
), pp.
783
788
.10.1007/s12598-014-0221-7
17.
ASTM International
,
2010
,
Designation: E112 – 10, Standard Test Methods for Determining Average Grain Size
,
ASTM International
,
West Conshohocken, PA
.10.1520/E0112-10
You do not currently have access to this content.