GaN-based high-power wide-bandgap semiconductor electronics and photonics have been considered as promising candidates to replace conventional devices for automotive applications due to high energy conversion efficiency, ruggedness, and superior transient performance. However, performance and reliability are detrimentally impacted by significant heat generation in the device active area. Therefore, thermal management plays a critical role in the development of GaN-based high-power electronic and photonic devices. This paper presents a comprehensive review of the thermal management strategies for GaN-based lateral power/RF transistors and light-emitting diodes (LEDs) reported by researchers in both industry and academia. The review is divided into three parts: (1) a survey of thermal metrology techniques, including infrared thermography, Raman thermometry, and thermoreflectance thermal imaging, that have been applied to study GaN electronics and photonics; (2) practical thermal management solutions for GaN power electronics; and (3) packaging techniques and cooling systems for GaN LEDs used in automotive lighting applications.
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June 2019
Review Articles
Thermal Management and Characterization of High-Power Wide-Bandgap Semiconductor Electronic and Photonic Devices in Automotive Applications
Seung Kyu Oh,
Seung Kyu Oh
Department of Mechanical Engineering,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207,
Houston, TX 77204-4006
e-mail: soh5@centeral.uh.edu
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207,
Houston, TX 77204-4006
e-mail: soh5@centeral.uh.edu
Search for other works by this author on:
James Spencer Lundh,
James Spencer Lundh
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: jvl6065@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: jvl6065@psu.edu
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Shahab Shervin,
Shahab Shervin
Department of Mechanical Engineering and
Advanced Manufacturing Institute,
University of Houston,
Houston, TX 77204-4006
e-mail: sshervin@central.uh.edu
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207
,Houston, TX 77204-4006
e-mail: sshervin@central.uh.edu
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Bikramjit Chatterjee,
Bikramjit Chatterjee
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: bpc5244@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: bpc5244@psu.edu
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Dong Kyu Lee,
Dong Kyu Lee
Department of Printed Electronics Engineering,
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: donggyu@sunchon.ac.kr
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: donggyu@sunchon.ac.kr
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Sukwon Choi,
Sukwon Choi
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: sukwon.choi@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: sukwon.choi@psu.edu
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Joon Seop Kwak,
Joon Seop Kwak
Department of Printed Electronics Engineering,
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: jskwak@sunchon.ac.kr
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: jskwak@sunchon.ac.kr
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Jae-Hyun Ryou
Jae-Hyun Ryou
Department of Mechanical Engineering,
Materials Science and Engineering Program,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
Houston, TX 77204-4006
e-mail: jryou@uh.edu
Materials Science and Engineering Program,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207
,Houston, TX 77204-4006
e-mail: jryou@uh.edu
Search for other works by this author on:
Seung Kyu Oh
Department of Mechanical Engineering,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207,
Houston, TX 77204-4006
e-mail: soh5@centeral.uh.edu
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207,
Houston, TX 77204-4006
e-mail: soh5@centeral.uh.edu
James Spencer Lundh
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: jvl6065@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: jvl6065@psu.edu
Shahab Shervin
Department of Mechanical Engineering and
Advanced Manufacturing Institute,
University of Houston,
Houston, TX 77204-4006
e-mail: sshervin@central.uh.edu
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207
,Houston, TX 77204-4006
e-mail: sshervin@central.uh.edu
Bikramjit Chatterjee
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: bpc5244@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: bpc5244@psu.edu
Dong Kyu Lee
Department of Printed Electronics Engineering,
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: donggyu@sunchon.ac.kr
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: donggyu@sunchon.ac.kr
Sukwon Choi
Department of Mechanical and
Nuclear Engineering,
The Pennsylvania State University,
University Park, PA 16802
e-mail: sukwon.choi@psu.edu
Nuclear Engineering,
The Pennsylvania State University,
306 Reber Building
,University Park, PA 16802
e-mail: sukwon.choi@psu.edu
Joon Seop Kwak
Department of Printed Electronics Engineering,
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: jskwak@sunchon.ac.kr
Sunchon National University,
Suncheon-si 57922, Jeollanam-do, South Korea
e-mail: jskwak@sunchon.ac.kr
Jae-Hyun Ryou
Department of Mechanical Engineering,
Materials Science and Engineering Program,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
Houston, TX 77204-4006
e-mail: jryou@uh.edu
Materials Science and Engineering Program,
Texas Center for Superconductivity
at University of Houston, and
Advanced Manufacturing Institute,
University of Houston,
4726 Calhoun Rd., Rm N207
,Houston, TX 77204-4006
e-mail: jryou@uh.edu
1The authors contributed equally to the paper.
2Corresponding authors.
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received March 21, 2018; final manuscript received October 12, 2018; published online February 25, 2019. Assoc. Editor: Sreekant Narumanchi.
J. Electron. Packag. Jun 2019, 141(2): 020801 (17 pages)
Published Online: February 25, 2019
Article history
Received:
March 21, 2018
Revised:
October 12, 2018
Citation
Oh, S. K., Lundh, J. S., Shervin, S., Chatterjee, B., Lee, D. K., Choi, S., Kwak, J. S., and Ryou, J. (February 25, 2019). "Thermal Management and Characterization of High-Power Wide-Bandgap Semiconductor Electronic and Photonic Devices in Automotive Applications." ASME. J. Electron. Packag. June 2019; 141(2): 020801. https://doi.org/10.1115/1.4041813
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