The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thin-film electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs.
Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received November 1, 2013; final manuscript received February 13, 2014; published online September 19, 2014. Assoc. Editor: Satish Chaparala.
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Sasagawa, K., Fujisaki, K., Unuma, J., and Azuma, R. (September 19, 2014). "Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density." ASME. J. Electron. Packag. December 2014; 136(4): 041011. https://doi.org/10.1115/1.4026878
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