This paper discusses the design for reliability of a wire bond structure in a power electronic module based on computational approach that integrates methods for high fidelity analysis, reduced order modeling, numerical risk analysis, and optimization. This methodology is demonstrated on a wire bond structure in a power electronic module with the aim of reducing the chance of failure due to the wire bond lift off in a power electronic module. In particular, wire bond reliability of the power module related to the thermal fatigue material degradation of aluminum wire is one of the main concerns. Understanding the performance, reliability, and robustness of wire bond is a key factor for the future development and success of the power electronic module technology. The main focus in this study is on the application of reduced order modeling techniques and the development of the associated models for fast design evaluation and analysis. The discussion is on methods for approximate response surface modeling based on interpolation techniques using Kriging and radial basis functions. The reduced order modeling approach uses prediction data for the electrothermomechanical behavior of the power module wire bond design obtained through nonlinear transient finite element simulations, in particular, for the fatigue lifetime of the aluminum wire attached to the silicon chip and the warpage (displacement) of the wire in the module. These reduced order models are used for the analysis of the effect of design uncertainties on the reliability of these advanced electronics modules. To assess the effect of uncertain design data, different methods for estimating the variation of reliability-related metrics of the wire bond model are researched and tested. Sample-based methods, such as full-scale Monte Carlo and Latin hypercube, and analytical approximate methods, such as first order second moment (FOSM) and point estimation method (PEM), are investigated, and their accuracy is compared. The optimization modeling analyzes the probabilistic nature of the reliability problem of the aluminum wire bond structures under investigation. Optimization tasks with design uncertainty are identified and solved using a particle swarm optimization algorithm. The probabilistic optimization deals with two different characteristic performance metrics of the design, the electrothermomechanical fatigue reliability of the aluminum wire attached to the chip and the thermally induced warpage of the wire in the module structure. The objective in this analysis is to ensure that the design has the required reliability and meets a number of additional requirements.
Skip Nav Destination
University of Greenwich,
SE10 9LS
Article navigation
June 2013
Research-Article
Application of Kriging and Radial Basis Function for Reliability Optimization in Power Modules
Pushparajah Rajaguru,
Chris Bailey
University of Greenwich,
SE10 9LS
Chris Bailey
Computational Mechanics and Reliability Group
,University of Greenwich,
SE10 9LS
London
, UK
Search for other works by this author on:
Pushparajah Rajaguru
e-mail: p.r.rajaguru@gre.ac.uk
Chris Bailey
Computational Mechanics and Reliability Group
,University of Greenwich,
SE10 9LS
London
, UK
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the Journal of Electronic Packaging. Manuscript received March 27, 2012; final manuscript received March 18, 2013; published online April 12, 2013. Assoc. Editor: Shidong Li.
J. Electron. Packag. Jun 2013, 135(2): 021009 (13 pages)
Published Online: April 12, 2013
Article history
Received:
March 27, 2012
Revision Received:
March 18, 2013
Citation
Rajaguru, P., Stoyanov, S., Lu, H., and Bailey, C. (April 12, 2013). "Application of Kriging and Radial Basis Function for Reliability Optimization in Power Modules." ASME. J. Electron. Packag. June 2013; 135(2): 021009. https://doi.org/10.1115/1.4024056
Download citation file:
Get Email Alerts
Cited By
High Gain and Wideband Antenna-in-Package Solution Using Fan-Out Technology
J. Electron. Packag (September 2023)
Process-Factor Optimization of Small-Area Sintered Interconnects for Power Electronics Applications
J. Electron. Packag (September 2023)
A Time Frequency Domain Based Approach for Ball Grid Array Solder Joint Fatigue Analysis Using Global Local Modeling Technique
J. Electron. Packag (September 2023)
Related Articles
Special Section on InterPACK 2013
J. Electron. Packag (December,2014)
Reliability-Based Design Guidance of Three-Dimensional Integrated Circuits Packaging Using Thermal Compression Bonding and Dummy Cu/Ni/SnAg Microbumps
J. Electron. Packag (September,2014)
Call for papers: Third ASRANet-2006, International Colloquium: Integration of Structural Analysis, Risk, and Reliability.
J. Offshore Mech. Arct. Eng (May,2005)
Sequential Design Process for Screening and Optimization of Robustness and Reliability Based on Finite Element Analysis and Meta-Modeling
J. Comput. Inf. Sci. Eng (August,2022)
Related Proceedings Papers
Related Chapters
SAPHIRE — Past, Present and Future (PSAM-0279)
Proceedings of the Eighth International Conference on Probabilistic Safety Assessment & Management (PSAM)
Simulation and Optimization of Injection Process for LCD Cover
Proceedings of the 2010 International Conference on Mechanical, Industrial, and Manufacturing Technologies (MIMT 2010)
Digital Transformation by the Implementation of the True Digital Twin Concept and Big Data Technology for Structural Integrity Management
Ageing and Life Extension of Offshore Facilities