We present an investigation into the effect of the motion of a printed circuit board (PCB) on the response of a microelectromechanical system (MEMS) device to shock loads. A two-degrees-of-freedom model is used to model the motion of the PCB and the microstructure, which can be a beam or a plate. The mechanical shock is represented as a single point force impacting the PCB. The effects of the fundamental natural frequency of the PCB, damping, shock pulse duration, electrostatic force, and their interactions are investigated. It is found that neglecting the PCB effect on the modeling of MEMS under shock loads can lead to erroneous predictions of the microstructure motion. Further, contradictory to what is mentioned in literature that a PCB, as a worst-case scenario, transfers the shock pulse to the microstructure without significantly altering its shape or intensity, we show that a poor design of the PCB or the MEMS package may result in severe amplification of the shock effect. This amplification can cause early pull-in instability for MEMS devices employing electrostatic forces.
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September 2008
Research Papers
An Investigation Into the Effect of the PCB Motion on the Dynamic Response of MEMS Devices Under Mechanical Shock Loads
Fadi Alsaleem,
Fadi Alsaleem
Department of Mechanical Engineering,
State University of New York at Binghamton
, Binghamton, NY 13902
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Mohammad I. Younis,
Mohammad I. Younis
Department of Mechanical Engineering,
e-mail: myounis@binghamton.edu
State University of New York at Binghamton
, Binghamton, NY 13902
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Ronald Miles
Ronald Miles
Department of Mechanical Engineering,
State University of New York at Binghamton
, Binghamton, NY 13902
Search for other works by this author on:
Fadi Alsaleem
Department of Mechanical Engineering,
State University of New York at Binghamton
, Binghamton, NY 13902
Mohammad I. Younis
Department of Mechanical Engineering,
State University of New York at Binghamton
, Binghamton, NY 13902e-mail: myounis@binghamton.edu
Ronald Miles
Department of Mechanical Engineering,
State University of New York at Binghamton
, Binghamton, NY 13902J. Electron. Packag. Sep 2008, 130(3): 031002 (10 pages)
Published Online: July 29, 2008
Article history
Received:
January 9, 2007
Revised:
January 14, 2008
Published:
July 29, 2008
Citation
Alsaleem, F., Younis, M. I., and Miles, R. (July 29, 2008). "An Investigation Into the Effect of the PCB Motion on the Dynamic Response of MEMS Devices Under Mechanical Shock Loads." ASME. J. Electron. Packag. September 2008; 130(3): 031002. https://doi.org/10.1115/1.2957319
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