The ball impact test is developed as a package-level measure of the board-level reliability of solder joints in the sense that it leads to brittle intermetallic fracturing, similar to that from a board-level drop test. Following classical structural dynamics principles, the ball impact test process is analyzed to provide insights into transient characteristics of this particular test methodology. A design guideline for the ball impact test apparatus based on characteristics of the measured impact force profile is proposed.

1.
Wong
,
E. H.
,
Rajoo
,
R.
,
Mai
,
Y. W.
,
Seah
,
S. K. W.
,
Tsai
,
K. T.
, and
Yap
,
L. M.
, 2005, “
Drop Impact: Fundamentals and Impact Characterisation of Solder Joints
,”
Proceedings 55th Electronic Components and Technology Conference
, Lake Buena Vista, FL, pp.
1202
1209
.
2.
Yeh
,
C.-L.
,
Lai
,
Y.-S.
,
Chang
,
H.-C.
, and
Chen
,
T.-H.
, 2005, “
Correlation Between Package-level Ball Impact Test and Board-level Drop Test
,”
Proceedings 7th Electronics Packaging Technology Conference
, Singapore, pp.
270
275
.
3.
Moon
,
H. J.
,
Lee
,
W. J.
,
Lee
,
D. Y.
,
Kim
,
B.
,
Kim
,
S. W.
,
Chung
,
T. G.
, and
Choi
,
H. K.
, 2004, “
Brittle Fracture of Pb-free Solder Joint in Ni∕Au Finished FBGA MCP Mounted on OSP Board Subjected to Bending Impact Load
,”
Proceedings 37th International Symposium on Microelectronics
, Long Beach, CA.
4.
Lai
,
Y.-S.
,
Yang
,
P.-F.
,
Yeh
,
C.-L.
, and
Tsai
,
C.-I.
, 2004, “
Board-level Drop Performance of Lead-free Chip-scale Packages With Different Soldermask Openings and Solder Compositions
,”
Proceedings 6th International Conference on Electronics Materials and Packaging
, Penang, Malaysia, pp.
56
60
.
5.
Lai
,
Y.-S.
,
Yang
,
P.-F.
, and
Yeh
,
C.-L.
, 2006, “
Experimental Studies of Board-level Reliability of Chip-scale Packages Subjected to JEDEC Drop Test Condition
,”
Microelectron. Reliab.
0026-2714,
46
(
2–4
), pp.
645
650
.
6.
Reiff
,
D.
, and
Bradley
,
E.
, 2005, “
A Novel Mechanical Shock Test Method to Evaluate Lead-free BGA Solder Joint Reliability
,”
Proceedings 55th Electronic Components and Technology Conference
, Lake Buena Vista, FL, pp.
1519
1525
.
7.
Lai
,
Y.-S.
,
Yang
,
P.-C.
,
Yeh
,
C.-L.
, and
Wang
,
T. H.
, 2005, “
Impact of Various JEDEC Drop Test Conditions on Board-level Reliability of Chip-scale Packages
,”
Proceedings 38th International Symposium on Microelectronics
, Philadelphia, PA, pp.
199
205
.
8.
Chong
,
D. Y. R.
,
Che
,
F. X.
,
Pang
,
J. H. L.
,
Ng
,
K.
,
Tan
,
J. Y. N.
, and
Low
,
P. T. H.
, 2006, “
Drop Impact Reliability Testing for Lead-free and Lead-based Soldered IC Packages
,”
Microelectron. Reliab.
0026-2714,
46
(
7
), pp.
1160
1171
.
9.
Date
,
M.
,
Shoji
,
T.
,
Fujiyoshi
,
M.
,
Sato
,
K.
, and
Tu
,
K. N.
, 2004, “
Ductile-to-brittle Transition in Sn-Zn Solder Joints Measured by Impact Test
,”
Scr. Mater.
1359-6462,
51
, pp.
641
645
.
10.
Ou
,
S.
,
Xu
,
Y.
,
Tu
,
K. N.
,
Alam
,
M. O.
, and
Chan
,
Y. C.
, 2005, “
Micro-impact Test on Lead-free BGA Balls on Au/Electrolytic Ni∕Cu Bond Pad
,”
Proceedings 55th Electronic Components and Technology Conference
, Lake Buena Vista, FL, pp.
467
471
.
11.
Newman
,
K.
, 2005, “
BGA Brittle Fracture—Alternative Solder Joint Integrity Test Methods
,”
Proceedings 55th Electronic Components and Technology Conference
, Lake Buena Vista, FL, pp.
1194
1201
.
12.
Yeh
,
C.-L.
,
Lai
,
Y.-S.
, and
Yang
,
P.-F.
, 2004, “
Transient Deformation and Fracturing of Solder Joints Subjected to Impact Loads
,”
Proceedings 9th IMAPS Topical Workshop on Flip Chip Technologies
, Austin, TX.
13.
Yeh
,
C.-L.
, and
Lai
,
Y.-S.
, 2004, “
Transient Simulation of Solder Joint Fracturing Under Impact Test
,”
Proceedings 6th Electronics Packaging Technology Conference
, Singapore, pp.
689
694
.
14.
Yeh
,
C.-L.
, and
Lai
,
Y.-S.
, 2005, “
Transient Analysis of Impact Fracturing of Solder Joints
,”
Proceedings EuroSimE 2005
, Berlin, Germany, pp.
503
509
.
15.
Yeh
,
C.-L.
, and
Lai
,
Y.-S.
, 2006, “
Transient Fracturing of Solder Joints Subjected to Displacement-controlled Impact Loads
,”
Microelectron. Reliab.
0026-2714,
46
(
5–6
), pp.
885
895
.
16.
Yeh
,
C.-L.
, and
Lai
,
Y.-S.
, 2006, “
Effects of Solder Alloy Constitutive Relationships on Impact Force Responses of Package-Level Solder Joints Under Ball Impact Test
,”
J. Electron. Mater.
0361-5235,
35
(
10
), pp.
1892
1901
.
17.
Huang
,
X.
,
Lee
,
S.-W. R.
,
Yuan
,
C. C.
, and
Hui
,
S.
, 2001, “
Characterization and Analysis on the Solder Ball Shear Testing Conditions
,”
Proceedings 51st Electronic Components and Technology Conference
, Orlando, FL, pp.
1065
1071
.
18.
Canumalla
,
S.
,
Yang
,
H.-D.
,
Viswanadham
,
P.
, and
Reinikainen
,
T. O.
, 2004, “
Package to Board Interconnection Shear Strength (PBISS): Effect of Surface Finish, PWB Build-up Layer and Chip Scale Package Structure
,”
IEEE Trans. Compon. Packag. Technol.
1521-3331,
27
(
1
), pp.
182
190
.
19.
Clough
,
R. W.
, and
Penzien
,
J.
, 1993,
Dynamics of Structures, 2nd ed.
,
McGraw-Hill
, New York.
20.
Tsai
,
T.-Y.
,
Yeh
,
C.-L.
,
Lai
,
Y.-S.
, and
Chen
,
R.-S.
, 2006, “
Response Spectra Analysis for Undamped Structural Systems Subjected to Half-sine Impact Acceleration Pulses
,”
Microelectron. Reliab.
, 0026-2714doi , in press.
You do not currently have access to this content.