The relative dielectric constant (10 kHz) of alumina was found to increase reversibly (by up to 13%) with compressive stress (up to 18 MPa). The effect of stress on the relative dielectric constant diminishes with increasing stress, such that it is almost absent when the stress exceeds . The relative dielectric constant is higher during loading than subsequent unloading.
Issue Section:
Research Papers
1.
Kulkarni
, A. K.
, Upadhyaya
, D. D.
, and Rao
, S. V. K.
, 1982, “Studies on Development of Alumina Substrates
,” Transactions of the Indian Ceramic Society
41
(2
), pp. 25
–29
.2.
Yatsuka
, H.
, Ishizaki
, M.
, Takano
, T.
, and Komizo
, H.
, 1980, “Millimeter-Wave IC Components Using Fine Grained Alumina Substrate
,” IEEE Mtt-S Int Microwave Symp Digest No. 80CH1545-3 MTT, pp. 276
–278
.3.
Frost
, H. M.
, and Shalek
, P. D.
, 1987, “High-Temperature Dielectric Measurements of High-Purity Alumina Ceramics
,” Conf. Digest - 12th Int. Conf. Infrared and Millimeter Waves
, IEEE, New York, No. 87CH2490-1, pp. 228
.4.
Ueyama
, T.
, Wada
, H.
, and Uehara
, H.
, 1988, “Influence of Alumina Contents and Firing Temperature on the Electrical Properties of Alumina Substrates
,” J. Jpn. Soc. Powder Powder Metall.
0532-8799 35
(8
), pp. 793
–798
.5.
Varma
, H. K.
, Mani
, T. V.
, Warrier
, K. G. K.
, Damodaran
, A. D.
, and Balachandran
, U.
, 1994, “Sintering of Thin Sheets of Alumina Prepared by the Sol-Spray Technique
,” J. Mater. Sci. Lett.
0261-8028 13
(7
), pp. 491
–493
.6.
Xia
, F.
, and Yao
, X.
, 2001, “Role of PbO Content on the Dielectric and Piezoelectric Properties of PZN-Based Ceramics
,” J. Mater. Sci.
0022-2461 36
(1
), pp. 247
–253
.7.
Hosono
, Y.
, Harada
, K.
, Yamashita
, Y.
, Dong
, M.
, and Ye
, Z.-G.
, 2000, “Growth, Electric and Thermal Properties of Lead Scandium Niobate-Lead Magnesium Niobate-Lead Titanate Ternary Single Crystals
,” Jpn. J. Appl. Phys., Part 1
0021-4922 39
(9
), pp. 5589
–5592
.8.
Kim
, G. B.
, and Choi
, S. W.
, 2000, “Dielectric, Pyroelectric and Piezoelectric Properties of 0.7Pb(Mg1∕3Nb2∕3)O3−0.3PbTiO3 Ceramics Modified With Ag2O
” Jpn. J. Appl. Phys., Part 1
0021-4922 39
(9B
), pp. 5552
–5555
.9.
Alberta
, E. F.
, Bhalla
, A. S.
, and Adachi
, M.
, 2000, “Temperature Dependence of the Piezoelectric and Dielectric Coefficients of Niobium-Doped Pb(Sc1∕2Nb1∕2)0.58Ti0.42O3 Ceramics
,” Ferroelectrics
0015-0193 242
(1-4
), pp. 13
–24
.10.
Yoon
, K. H.
, and Lee
, H. R.
, 2000, “Effect of Ba2 Plus Substitution on Dielectric and Electric-Field-Induced Strain Properties of PMN-PZ-PT Ceramics
,” J. Am. Ceram. Soc.
0002-7820 83
(11
), pp. 2693
–2698
.11.
Rukmini
, H. R.
, Choudhary
, R. N. P.
, and Prabhakara
, D. L.
, 2000, “Sintering Dependent Physical and Dielectric Properties of Pb0.91La0.09Zr0.65Ti0.35O3 Ceramics
,” J. Mater. Sci. Lett.
0261-8028 19
(19
), pp. 1705
–1708
.12.
Cho
, Y. S.
, Pilgrim
, S. M.
, Giesche
, H.
, and Bridger
, K.
, 2000, “Dielectric and Electromechanical Properties of Chemically Modified PMN-PT-BT Ceramics
,” J. Am. Ceram. Soc.
0002-7820 83
(10
), pp. 2473
–2480
.13.
Sundar
, V.
, and Newnham
, R. E.
, 1996, “Converse Method Measurements of Electrostriction Coefficients in Low-K Dielectrics
,” Mater. Res. Bull.
0025-5408 31
(5
), pp. 545
–554
.14.
Valbin
, L.
, Sevely
, L.
, and Spirkovitch
, S.
, 2000, “Low Temperature Piezoelectric Aluminum Nitride Thin Film
,” Proc. SPIE–The Int. Society for Optical Engineering, Micromachining and Microfabrication Process Technology
, SPIE, Bellingham
, WA, Vol. 4174
, pp. 154
–163
.Copyright © 2005
by American Society of Mechanical Engineers
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