Air-firable glass-free metal electrically conductive thick film pastes of different compositions were developed by using a titanium alloy component, and tin and zinc metal substitutes for glass frit used in traditional thick film pastes. The effect of different components on the electrical resistivity and bonding between the thick film and the alumina substrate was investigated. Thick films with low electrical resistivity and good bonding to the alumina substrate were obtained by using silver, zinc, tin, and TiCu alloy powders in the pastes. The addition of zinc at a small proportion (<0.5 wt.%) to a thick film paste enhanced the adhesion between the thick film and the alumina substrate with negligible increase in the electrical resistivity. The use of titanium alloy powder instead of pure titanium powder is preferred. Better composition distribution, and consequently, better wetting and bonding are expected by using active metal particles of a smaller size.
Skip Nav Destination
e-mail: ddlchung@acsu.buffalo.edu
Article navigation
March 2001
Technical Papers
Development of Glass-Free Metal Electrically Conductive Thick Films
Zongrong Liu,
Zongrong Liu
Composite Materials Research Laboratory, State University of New York at Buffalo, Buffalo, NY 14260-4400
Search for other works by this author on:
D. D. L. Chung
e-mail: ddlchung@acsu.buffalo.edu
D. D. L. Chung
Composite Materials Research Laboratory, State University of New York at Buffalo, Buffalo, NY 14260-4400
Search for other works by this author on:
Zongrong Liu
Composite Materials Research Laboratory, State University of New York at Buffalo, Buffalo, NY 14260-4400
D. D. L. Chung
Composite Materials Research Laboratory, State University of New York at Buffalo, Buffalo, NY 14260-4400
e-mail: ddlchung@acsu.buffalo.edu
Contributed by the Electrical and Electronic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received by the EEPD July 13, 2000. Associate Editor: B. Coutois.
J. Electron. Packag. Mar 2001, 123(1): 64-69 (6 pages)
Published Online: July 13, 2000
Article history
Received:
July 13, 2000
Citation
Liu , Z., and Chung, D. D. L. (July 13, 2000). "Development of Glass-Free Metal Electrically Conductive Thick Films ." ASME. J. Electron. Packag. March 2001; 123(1): 64–69. https://doi.org/10.1115/1.1329131
Download citation file:
Get Email Alerts
Cited By
Impact of Encapsulated Phase Change Material Additives for Improved Thermal Performance of Silicone Gel Insulation
J. Electron. Packag (December 2024)
Special Issue on InterPACK2023
J. Electron. Packag
Extreme Drop Durability of Sintered Silver Traces Printed With Extrusion and Aerosol Jet Processes
J. Electron. Packag (December 2024)
Related Articles
Erratum: “Development of Glass-Free Metal Electrically Conductive Thick Films” [ASME J. Electron. Packag., 123 , No. 1, pp. 64–69]
J. Electron. Packag (June,2001)
The Influence of Thermoplastic Film Interleaving on the Interlaminar Shear Strength and Mode I Fracture of Laminated Composites
J. Eng. Mater. Technol (July,1996)
Effect of Nonlinear Elastic Behavior on Bilayer Decohesion of Thin Metal Films From Nonmetal Substrates
J. Appl. Mech (July,2002)
Related Proceedings Papers
Related Chapters
Use of Fracture Mechanics Concepts in Testing of Film Adhesion
Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings
Adherence Measurements and Evaluation of Thick-Film Platinum-Gold
Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings
Adhesion Measurements on Thick-Film Conductors
Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings