The effect of underfill material on reliability of flip chip on board (FCOB) assemblies is investigated in this study by using two-dimensional and three-dimensional finite element simulations under thermal cycling stresses from −55°C to 80°C. Accelerated testing of FCOB conducted by the authors reveals that the presence of underfill can increase the fatigue durability of solder interconnects by two orders of magnitude. Similar data has been extensively reported in the literature. It is the intent of this paper to develop a generic and fundamental predictive model that explains this trend. While empirical models have been reported by other investigators based on experimental data, the main drawback is that many of these empirical models are not truly predictive, and can not be applied to different flip chip architectures using different underfills. In the proposed model, the energy-partitioning (EP) damage model is enhanced in order to capture the underlying mechanisms so that a predictive capability can be developed. A two-dimensional finite element model is developed for stress analysis. This model accounts for underfill over regions of solder in an approximate manner by using overlay elements, and is calibrated using a three-dimensional finite element model. The model constant for the enhanced EP model is derived by fitting model predictions (combination of two-dimensional and three-dimensional model results) to experimental results for a given temperature history. The accuracy of the enhanced EP model is then verified for a different loading profile. The modeling not only reveals the influence of underfill material on solder joint durability, but also provides the acceleration factor to assess durability under life cycle environment, from accelerated test results. Experimental results are used to validate the trends predicted by the analytical model. The final goal is to define the optimum design and process parameters of the underfill material in FCOB assemblies in order to extend the fatigue endurance of the solder joints under cyclic thermal loading environments.
Skip Nav Destination
Article navigation
December 1999
Technical Papers
Thermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 2—With Underfill
K. Darbha,
K. Darbha
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
Search for other works by this author on:
J. H. Okura,
J. H. Okura
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
Search for other works by this author on:
S. Shetty,
S. Shetty
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
Search for other works by this author on:
A. Dasgupta,
A. Dasgupta
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
Search for other works by this author on:
T. Reinikainen,
T. Reinikainen
Nokia Research Center, Finland and USA
Search for other works by this author on:
J. F. J. M. Caers
J. F. J. M. Caers
Philips Center for Manufacturing Technology, P. O. Box 218, 5600 MD Eindhoven, The Netherlands
Search for other works by this author on:
K. Darbha
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
J. H. Okura
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
S. Shetty
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
A. Dasgupta
CALCE Electronic Products and Systems Consortium, University of Maryland, College Park, MD 20742
T. Reinikainen
Nokia Research Center, Finland and USA
J. Zhu
Nokia Research Center, Finland and USA
J. F. J. M. Caers
Philips Center for Manufacturing Technology, P. O. Box 218, 5600 MD Eindhoven, The Netherlands
J. Electron. Packag. Dec 1999, 121(4): 237-241 (5 pages)
Published Online: December 1, 1999
Article history
Received:
January 15, 1999
Revised:
May 27, 1999
Online:
November 5, 2007
Citation
Darbha, K., Okura, J. H., Shetty, S., Dasgupta, A., Reinikainen, T., Zhu, J., and Caers, J. F. J. M. (December 1, 1999). "Thermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 2—With Underfill." ASME. J. Electron. Packag. December 1999; 121(4): 237–241. https://doi.org/10.1115/1.2793846
Download citation file:
Get Email Alerts
Impact of Encapsulated Phase Change Material Additives for Improved Thermal Performance of Silicone Gel Insulation
J. Electron. Packag (December 2024)
Special Issue on InterPACK2023
J. Electron. Packag
Extreme Drop Durability of Sintered Silver Traces Printed With Extrusion and Aerosol Jet Processes
J. Electron. Packag (December 2024)
Related Articles
Thermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 1—Without Underfill
J. Electron. Packag (December,1999)
Effect of Voids on Thermomechanical Durability of Pb-Free BGA Solder Joints: Modeling and Simulation
J. Electron. Packag (September,2007)
Reliability Analysis of Flip Chip Designs Via Computer Simulation
J. Electron. Packag (September,2000)
Thermomechanical Durability of High I/O BGA Packages
J. Electron. Packag (September,2002)
Related Proceedings Papers
Related Chapters
Subsection NB—Class 1 Components
Companion Guide to the ASME Boiler & Pressure Vessel Code, Volume 1, Second Edition
Subsection NF—Supports
Companion Guide to the ASME Boiler & Pressure Vessel Codes, Volume 1 Sixth Edition
Industrially-Relevant Multiscale Modeling of Hydrogen Assisted Degradation
International Hydrogen Conference (IHC 2012): Hydrogen-Materials Interactions