An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form solution for the average number of faults (AD0) in an IC is obtained for a given IC yield (Y). Furthermore, based on the new IC yield formula a simple equation for determining the number of yielded chips in a wafer is given. Finally, the multichip module yield (Ym) and resultant shipped multichip module yield (Yms) based on the new IC yield formula are provided.

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