Parametric studies are performed on heat transfer in surface-mounted components of conduction cooled Standard Electronic Modules (SEMs). Thermal network models are developed for the various components that are used in the SEMs. The models are validated by comparing the results with available experimental results from various test modules. An interfacing software package for thermal analysis (IN-STAN) is used to generate the thermal network representations of the models and a thermal network analyzer is used to perform the analysis. Several studies are performed to analyze the effects of important thermal design parameters including: chip and carrier size, cavity floor thickness, air gap thickness, die and carrier materials, and solder material.
Parametric Studies for Thermal Design of Surface Mounted Components of Standard Electronic Modules
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Hadim, A., and Nagurny, N. J. (September 1, 1992). "Parametric Studies for Thermal Design of Surface Mounted Components of Standard Electronic Modules." ASME. J. Electron. Packag. September 1992; 114(3): 300–304. https://doi.org/10.1115/1.2905454
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