Skip to Main Content

Taguchi Methods: Benefits, Impacts, Mathematics, Statistics and Applications

By
Teruo Mori, PhD
Teruo Mori, PhD
PE
Search for other works by this author on:
Shih-Chung Tsai, PhD
Shih-Chung Tsai, PhD
CQE
Search for other works by this author on:
ISBN:
9780791859698
No. of Pages:
1060
Publisher:
ASME Press
Publication date:
2011

Data goes missing when test samples fall, experimental data is recorded incorrectly, measurements are incorrect, samples don't match factor level settings, or when there is no measurable quantity for the output responses, etc. In some cases, the test samples are made appropriately but the testing equipment does not function correctly (for example, there is a driving motor malfunction or a copy machine does not work as intended). In some reliability or durability tests, the output response data is not obtained because the samples don't yield under the loads within the test duration.

If samples are correctly made and the data is missing because of insufficient functionality of the target system, it is common to apply reasonable replacement values for the missing data. For example, you can use the minimum measured S/N (signal-to-noise) value minus 3 (dB) to estimate the missing S/N ratio data due to insufficient functionality [or the maximum measured S/N value plus 3 (dB) for excessive functionality such as surviving a durability].

This chapter illustrates how to calculate reasonable replacement values as estimates for data that's missing because of any number of experimental incidents.

You do not currently have access to this chapter.
Close Modal
This Feature Is Available To Subscribers Only

Sign In or Create an Account

Close Modal
Close Modal