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International Conference on Mechanical and Electrical Technology 2009 (ICMET 2009)

By
Wenzheng Li
Wenzheng Li
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ISBN:
9780791802946
No. of Pages:
287
Publisher:
ASME Press
Publication date:
2009

X-series cylinder was adopted for accelerated test, whose acceleration stress includes temperature and velocity under use level conditions of 308K and 0.25m/s. Life data were collected and estimated based on Eyring-Weibull distribution. Data statistics, evaluation and transformation concerning accelerated life test were performed based on statistical theories that are related to Eyring-Weibull model, and cylinder reliability indices under normal stress conditions were reproduced accurately with temperature and velocity being used as the reliability information of accelerated stress to transform results.

Abstract
I. Introduction
II. Theory of Eyring-Weibull Distribution
III. Test Design
IV. Estimation of Life Parameters
Conclusions
References
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