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ASME Press Select Proceedings
International Conference on Computer Technology and Development, 3rd (ICCTD 2011)
By
Jianhong Zhou
Jianhong Zhou
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ISBN:
9780791859919
No. of Pages:
2000
Publisher:
ASME Press
Publication date:
2011

In order to improving reliability and economy of down-lead bonding of MEMS packaging , NiPdAu PCB is leaded in ,because palladium is joined in protecting involucra , bonding technology parameter must change . In this paper, robust parameter design method of MINITAB software is used and optimize bonding technology parameter of new type NiPdAu involucra has been discovered , according to optimize results , mending bonding technology parameter and Ni Pd Au PCB is triumphantly used into MEMS packaging technology , not only increasing reliability of products , but also reducing cost of raw materials and obtaining well economy benefit.

Abstract
Key Words
I. Introduction
II. Factors of Affect Spun Gold Bonding Quality
III. Using Robust Parameter Design Optimize Bondin Technology Parameter
IV. Validate Experiment
V. Conclusion
Acknowledgements
References
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