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ASME Press Select Proceedings

International Conference on Computer Technology and Development, 3rd (ICCTD 2011)

By
Jianhong Zhou
Jianhong Zhou
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ISBN:
9780791859919
No. of Pages:
2000
Publisher:
ASME Press
Publication date:
2011

Fault-tolerant microcontroller units (MCU) are becoming a standard requirement in the automotive industry. In this paper, we research three fault-tolerant architectures for automotive applications. Then a fully study and comparison in reliability has been applied to these different architectures through markov modeling. The analysis shows that the enhanced dual-CPU architecture outperforms higher reliability which reduces the risk 6.3 times better than the dual-CPU lock-step architecture at most, 2.7 times better than the triple module redundancy architecture.

Abstract
Key Words
1 Introduction
2. A Survey of Faulttolerant Multiprocessor Architectures
3. Reliability Analysis Based on Markov Model
4. Results
5. Conclusions
References
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