166 Analyzing Thermal and Flicker Noise Fault-Tolerance Capability of Markov Random Field Digital Circuits

Markov Random Field (MRF) is known to be a fault-tolerance design technique that transforms simple CMOS to MRF-CMOS digital circuits. The transformed circuits are thus extremely noise-tolerant i.e. in presence of extreme noise interference; the output current levels have un-noticeable distortion. Although this technique has proved to be a solution for thermal noise only; we have extended the noise-tolerance capability of MRF circuits for flicker noise in this paper. The integration of thermal and flicker noise generates complex and time-consuming simulations that have been performed on Cadence-Virtuoso simulation software. Results show that the MRF design is elegant enough to cater both kinds of noise.