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International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)

By
Chen Ming
Chen Ming
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ISBN:
9780791859902
No. of Pages:
1400
Publisher:
ASME Press
Publication date:
2011

Comparing with traditional accelerated life test, an escalating tendency has been to adopt the accelerated degradation test (ADT) which has the superiorities such as short test time, low cost, enough numbers and high estimating accuracy. Meanwhile, with the Dynamic Turned Gyroscopes (DTG) engineered, it is more intensive to get its lifespan and reliability index, etc. So in order to obtain reliable DTG lifespan and reliability index with fewer time and cost, the advance accelerated test technique and evaluating lifespan method arc more important for the research of DTG lifespan and reliability.

For these reasons, based on the reliability test technique,...

Abstract
Keywords:
Introduction
ADT
Degeneration Performance of DTG
Feasibility of Accelerated Degradation for DTG
Conclusions
References
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