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International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)

By
Chen Ming
Chen Ming
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ISBN:
9780791859902
No. of Pages:
1400
Publisher:
ASME Press
Publication date:
2011

Comparing with traditional accelerated life test, an escalating tendency has been to adopt the accelerated degradation test (ADT) which has the superiorities such as short test time, low cost, enough numbers and high estimating accuracy. Meanwhile, with the Dynamic Turned Gyroscopes (DTG) engineered, it is more intensive to get its lifespan and reliability index, etc. So in order to obtain reliable DTG lifespan and reliability index with fewer time and cost, the advance accelerated test technique and evaluating lifespan method arc more important for the research of DTG lifespan and reliability.

For these reasons, based on the reliability test technique, the feasibility of accelerated degradation test for DTG was studied in this paper. Firstly, the performance variation of components used for DTG in long-term application condition can be given by the analysis of failure mode and cause, and the effect on the DTG was analyzed. The possibility of the performance degradation of DTG was illustrated, which was proved by experimental data of DTG for long-term application. With the research results that temperature is the main fact affecting output characteristics of DTG the reliability pre-research test was utilized to study the accelerating ability of DTG performance degradation with temperature environment stress. By analyzing the performance data under temperature-accelerated stress, the accelerated ability of performance degradation was demonstrated. All of the above proves the feasible of accelerated degradation test for DTG. Furthermore, the research of this paper lays a foundation for DTG accelerated degradation test development and makes prepare for the analysis of DTG reliability.

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