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ASME Press Select Proceedings
International Conference on Information Technology and Management Engineering (ITME 2011)
Editor
W. X. Wang
W. X. Wang
Royal Institute of Technology
, Sweden
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ISBN:
9780791859827
No. of Pages:
500
Publisher:
ASME Press
Publication date:
2011
eBook Chapter
40 Test and Diagnosis Model of Complicated Integrated Circuit with CPU
By
Jiangping Yang
Department of Land-based Early Warning Equipment, Air Force Radar Academy , Wuhan, 430019 , China ; yjp_wh@163.com
,
Jiangping Yang
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Yu Zhang
School of Electrical & Electronic Engineering, Hubei University of Technology , Wuhan, 430019 , China ; Zhangyu.3383@163.com
,
Yu Zhang
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Chunhe Chang
Department of Land-based Early Warning Equipment, Air Force Radar Academy , Wuhan, 430019 , China ; cch1725@163.com
Chunhe Chang
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Page Count:
4
-
Published:2011
Citation
Yang, J, Zhang, Y, & Chang, C. "Test and Diagnosis Model of Complicated Integrated Circuit with CPU." International Conference on Information Technology and Management Engineering (ITME 2011). Ed. Hu, WB, & Wang, WX. ASME Press, 2011.
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Focus on the problem that test signals is difficult to describe in the microprocessor (CPU) and digital signal processor (DSP) circuit, this paper proposes a matrix base method to describe program signal and instruction signal, thus in theory solve the above problem. In the proposed method, simple hardware circuit can be used to produce different test signal needed in the test and diagnose of CPU circuit.
Abstract
Keywords
Introduction
Matrix Base Description Method of Program and Instruction
Realization of Test and Diagnosis
Acknowledgments
References
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