Skip to Main Content
Skip Nav Destination
ASME Press Select Proceedings

International Conference on Information Technology and Computer Science, 3rd (ITCS 2011)

Editor
V. E. Muhin
V. E. Muhin
National Technical University of Ukraine
Search for other works by this author on:
W. B. Hu
W. B. Hu
Wuhan University
Search for other works by this author on:
ISBN:
9780791859742
No. of Pages:
656
Publisher:
ASME Press
Publication date:
2011

Traditional instrument-oriented Test Program Set (TPS) include lots of instructions(codes) to operate instruments, which deeply lower the transportability of software and the interchangeability of instruments. IEEE set a series of ATML standard documents, which can remedy these shortcomings. The paper briefly summarizes the design methodology of traditional TPS; focus on a new way of TPS design based on ATML. The instantiated application of the FaultTreeModel Schema in this paper may be useful for those who want to use ATML standard to design their TPS.

This content is only available via PDF.
You do not currently have access to this chapter.
Close Modal

or Create an Account

Close Modal
Close Modal