Skip to Main Content
ASME Press Select Proceedings

International Conference on Mechanical Engineering and Technology (ICMET-London 2011)

Editor
Garry Lee
Garry Lee
Information Engineering Research Institute
Search for other works by this author on:
ISBN:
9780791859896
No. of Pages:
906
Publisher:
ASME Press
Publication date:
2011

An efficient rate-compatible (RC) puncturing scheme for LDPC codes is proposed, which tries to distribute the punctured bits as evenly as possible while maximizing the number of 1-SR nodes in Tanner graph. The puncturing scheme can produce RC LDPC with rates ranging from the mother code rate through even 1. Simulation results show that the new puncturing method is superior to random puncturing and the method in [2].

Abstract
Keywords
Introduction
Proposed Puncturing Algorithm
Simulation Results
Conclusion
Acknowledgment
Refernces
This content is only available via PDF.
Close Modal
This Feature Is Available To Subscribers Only

Sign In or Create an Account

Close Modal
Close Modal