Skip to Main Content
Skip Nav Destination
ASME Press Select Proceedings
International Conference on Computer and Electrical Engineering 4th (ICCEE 2011)
By
Jianhong Zhou
Jianhong Zhou
Search for other works by this author on:
ISBN:
9780791859841
No. of Pages:
698
Publisher:
ASME Press
Publication date:
2011

The electrochemical anodization technology was applied to enhance the high-temperature performance of the porous silicon carbide (SiC) p-n junction photodiode fabricated on a Si substrate. Higher photo-responsivity, lower dark current, and larger photo/dark current ratios at elevated temperatures were obtained for the devices developed with the anodization treatment. The mechanism of improvement on the device's high-temperature optoelectronic characteristics has been studied and it is found that the porous p/n SiC structures formed during the anodical process play a key role wherein.

Abstract
Key Words
1 Introduction
2. Device Fabrication
3 Results and Discussion
4. Summaries
References
This content is only available via PDF.
You do not currently have access to this chapter.
Close Modal

or Create an Account

Close Modal
Close Modal