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ASME Press Select Proceedings
International Conference on Computer and Electrical Engineering 4th (ICCEE 2011)
ISBN:
9780791859841
No. of Pages:
698
Publisher:
ASME Press
Publication date:
2011
eBook Chapter
79 Fabrication of Silicon Carbide Photodiodes with Enhanced High-Temperature Performance by Electrochemical Anodization Technology
By
Kuen-Hsien Wu
,
Kuen-Hsien Wu
Department of Electro-Optical Engineering,
Southern Taiwan University
, Taiwan
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Y. C. Wang
,
Y. C. Wang
Orbotech Pacific Ltd.
, Taiwan Branch, Taiwan
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Ray Tsao
Ray Tsao
Orbotech Pacific Ltd.
, Taiwan Branch, Taiwan
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Page Count:
5
-
Published:2011
Citation
Wu, K, Wang, YC, & Tsao, R. "Fabrication of Silicon Carbide Photodiodes with Enhanced High-Temperature Performance by Electrochemical Anodization Technology." International Conference on Computer and Electrical Engineering 4th (ICCEE 2011). Ed. Zhou, J. ASME Press, 2011.
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The electrochemical anodization technology was applied to enhance the high-temperature performance of the porous silicon carbide (SiC) p-n junction photodiode fabricated on a Si substrate. Higher photo-responsivity, lower dark current, and larger photo/dark current ratios at elevated temperatures were obtained for the devices developed with the anodization treatment. The mechanism of improvement on the device's high-temperature optoelectronic characteristics has been studied and it is found that the porous p/n SiC structures formed during the anodical process play a key role wherein.
Abstract
Key Words
1 Introduction
2. Device Fabrication
3 Results and Discussion
4. Summaries
References
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