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ASME Press Select Proceedings

International Conference on Computer and Electrical Engineering 4th (ICCEE 2011)

By
Jianhong Zhou
Jianhong Zhou
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ISBN:
9780791859841
No. of Pages:
698
Publisher:
ASME Press
Publication date:
2011

The vertical displacement of the surface graphene layer on graphite is performed with the tip of the Scanning Tunneling Microscope (STM) during imaging, mediated by the tipsample interaction. This surface decoupling spanning several tens of nm laterally is manifested in the observation of a switch between the triangular and honeycomb electronic structure of the Moir1 pattern. We demonstrate that the probability of displacement can be controlled or increased either by (i) reducing the scanning area of interest or by (ii) decreasing the tip-surface distance.

Abstract
Key Words
1 Introduction
2. Experimental Procedures
3. Results and Discussion
4. Summaries
References
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