The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.
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January 2013
Research-Article
Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing
Fathi H. Ghorbel,
Fathi H. Ghorbel
1
Department of Mechanical Engineering and Materials Science,
Rice University
,Houston, TX 77005
1Corresponding author.
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James B. Dabney
James B. Dabney
Department of Systems Engineering,
University of Houston—Clear Lake
,Houston, TX 77058
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Fathi H. Ghorbel
Department of Mechanical Engineering and Materials Science,
Rice University
,Houston, TX 77005
James B. Dabney
Department of Systems Engineering,
University of Houston—Clear Lake
,Houston, TX 77058
1Corresponding author.
Contributed by the Dynamic Systems Division of ASME for publication in the JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL. Manuscript received December 7, 2009; final manuscript received February 21, 2012; published online October 30, 2012. Assoc. Editor: Nader Jalili.
J. Dyn. Sys., Meas., Control. Jan 2013, 135(1): 011002 (6 pages)
Published Online: October 30, 2012
Article history
Received:
December 7, 2009
Revision Received:
February 21, 2012
Citation
Landolsi, F., Ghorbel, F. H., and Dabney, J. B. (October 30, 2012). "Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing." ASME. J. Dyn. Sys., Meas., Control. January 2013; 135(1): 011002. https://doi.org/10.1115/1.4006370
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