The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.
Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing
Contributed by the Dynamic Systems Division of ASME for publication in the JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL. Manuscript received December 7, 2009; final manuscript received February 21, 2012; published online October 30, 2012. Assoc. Editor: Nader Jalili.
- Views Icon Views
- Share Icon Share
- Cite Icon Cite
- Search Site
Landolsi, F., Ghorbel, F. H., and Dabney, J. B. (October 30, 2012). "Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing." ASME. J. Dyn. Sys., Meas., Control. January 2013; 135(1): 011002. https://doi.org/10.1115/1.4006370
Download citation file:
- Ris (Zotero)
- Reference Manager