The use of fringe-field capacitive sensing for surface profile measurement during the turning process is described. Measurements of the local surface height are inferred from variations in a fringe electric field induced between the sensing element and the workpiece. The surface profile is determined from high-speed scanning of the sensing element across the surface. The technique is particularly well-suited to the relatively harsh environment of in-process measurement. We have implemented a system in which profile measurements are made continuously, in real-time, and immediately adjacent to the cutting tool. The results of tests conducted to determine the accuracy and sensitivity of this capacitive profilometer are presented. In-process measurements of surfaces generated by turning with roughness in the range of 0.3 to 4.0 μm were made. Comparisons with static profile measurements made using standard stylus instrumentation are presented, and show quantitative agreement.
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June 1992
Research Papers
Surface Profile Measurement During Turning Using Fringe-Field Capacitive Profilometry
J. L. Garbini,
J. L. Garbini
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
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Sih-Ping Koh,
Sih-Ping Koh
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
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Jens E. Jorgensen,
Jens E. Jorgensen
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
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Mamidala Ramulu
Mamidala Ramulu
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
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J. L. Garbini
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
Sih-Ping Koh
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
Jens E. Jorgensen
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
Mamidala Ramulu
Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195
J. Dyn. Sys., Meas., Control. Jun 1992, 114(2): 234-243 (10 pages)
Published Online: June 1, 1992
Article history
Received:
September 5, 1990
Revised:
July 1, 1991
Online:
March 17, 2008
Citation
Garbini, J. L., Koh, S., Jorgensen, J. E., and Ramulu, M. (June 1, 1992). "Surface Profile Measurement During Turning Using Fringe-Field Capacitive Profilometry." ASME. J. Dyn. Sys., Meas., Control. June 1992; 114(2): 234–243. https://doi.org/10.1115/1.2896520
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