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Issues
July 1997
ISSN 0884-6804
In this Issue
Research Papers
The Wyoming Combined Loading Compression (CLC) Test Method
J. Compos. Technol. Res.. July 1997, 19(3): 123–133.
doi: https://doi.org/10.1520/CTR10023J
Effect of Time-Dependent Matrix Behavior on the Evolution of Processing-Induced Residual Stresses in Metal Matrix Composites
J. Compos. Technol. Res.. July 1997, 19(3): 134–141.
doi: https://doi.org/10.1520/CTR10024J
Matrix Cracking of High-Performance Composite Laminates with Variation of Laminate Stacking Sequence and Testing Temperature
J. Compos. Technol. Res.. July 1997, 19(3): 142–151.
doi: https://doi.org/10.1520/CTR10025J
Strain Gage Selection Criteria for Textile Composite Materials
J. Compos. Technol. Res.. July 1997, 19(3): 152–167.
doi: https://doi.org/10.1520/CTR10026J
The Effect of Voids on the Elastic Properties of Textile Reinforced Composites
J. Compos. Technol. Res.. July 1997, 19(3): 168–173.
doi: https://doi.org/10.1520/CTR10027J
Evaluation of the Edge Crack Torsion (ECT) Test for Mode III Interlaminar Fracture Toughness of Laminated Composites
J. Compos. Technol. Res.. July 1997, 19(3): 174–183.
doi: https://doi.org/10.1520/CTR10028J
Hoop Tensile Strength and Fracture Behavior of Continuous Fiber Ceramic Composite (CFCC) Tubes from Ambient to Elevated Temperatures
J. Compos. Technol. Res.. July 1997, 19(3): 184–190.
doi: https://doi.org/10.1520/CTR10029J
Article
Miscellaneous Information
J. Compos. Technol. Res.. July 1997, 19(3): 191–192.
doi: https://doi.org/10.1520/CTR10030J
Mechanics of Composite Materials: Past, Present, and Future
J. Compos. Technol. Res. (March 1989)
Abrasive Water Jet Machining Mechanisms in Continuous-Fiber Ceramic Composites
J. Compos. Technol. Res. (April 2001)
Delamination Growth and Thresholds in a Carbon/Epoxy Composite Under Fatigue Loading
J. Compos. Technol. Res. (April 2001)
High Strain Rate Characterization of a Glass/Epoxy Composite
J. Compos. Technol. Res. (January 2000)
A Technique for Measuring Delamination Crack Tip Behavior in Composite Materials Inside a Scanning Electron Microscope
J. Compos. Technol. Res. (July 2001)
